Texas Instruments Corporation

Hisashi Ata

Thiha Shwe

Kay Chan Tong

Phillip Marcus Blitz

James L Oborny

Jonathan Hsu

Martin Whitfield

John Allen Hite

Felix Martinez

Dennis Anhalt

A reduced pin count (RPC) device includes an electrical circuitry in a package with uniformly distributed leads, a subset of the leads being electrically disconnected form the circuitry. A contactor pin block with sockets corresponding to the uniformly distributed leads has the sockets corresponding to the leads with electrical connections filled with test pins suitable for contacting respective leads, and the sockets corresponding to the electrically disconnected leads voided of test pins. Dummy plugs are inserted into the voided sockets to block the sockets and prevent accidental insertions of test pins.

Systems and methods for depopulating pins from contactor test sockets for packaged semiconductor devices

A system comprises: a contactor having a first surface, a second surface, a first hole, a second hole parallel to the first hole, and a third hole parallel to the first hole; a first signal pin held in the first hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor; a first short ground pin held in the second hole of the contactor, extending to at least the second surface of the contactor, and extending within the first surface of the contactor; and a ground pin held in the third hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor.

Contactors with signal pins, ground pins, and short ground pins

An interposer comprises an insulating substrate having a first side and a second side; a first plurality of metal contacts on the first side; a second plurality of metal contacts on the second side; and a plurality of cuts through the insulating substrate. The plurality of cuts comprise a first cut between a first metal contact in the first plurality of metal contacts and a second metal contact in the first plurality of metal contacts, and between a first metal contact in the second plurality of metal contacts and a second metal contact in the second plurality of metal contacts.

Interposers having cuts through an insulating substrate

A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a split plunger member comprised of an upper split plunger part separated from a lower split plunger part separated by a diagonal cut reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the upper split plunger part and the second end of the internal cavity. A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first split plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second split plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. The first and second split plunger members are each comprised of two parts: a first upper plunger part separated from a first lower plunger part by a diagonal cut. A spring member is positioned in the internal cavity between the first and second upper split plunger parts. In each split plunger the diagonal surface of the upper split plunger part exerts a transverse force to the diagonal surface of the lower split plunger part ensuring good electrical contact between the lower split plunger member part and the barrel wall.

Force biased spring probe pin assembly

A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one rectangular cavity formed in the plunger member with a movable cylindrical bearing in the cavity that applies a slight transverse force to the plunger member ensuring good electrical contact between the plunger and the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. A spring member is positioned in the internal cavity between the first plunger member and the second plunger member. At least one rectangular cavity formed in the first plunger member with a first movable cylindrical bearing in the cavity that applies a slight transverse force to the first plunger member ensuring good electrical contact between the first plunger member and the wall of the barrel member and at least one rectangular cavity formed in the second plunger member with a second movable cylindrical bearing in the cavity that applies a slight transverse force to the second plunger member ensuring good electrical contact between the second plunger member and the wall of the barrel member.

A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. At least one cavity formed in the plunger member with a conductive bearing in the cavity in electrical contact with the plunger and with the wall of the barrel member. A force-biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. A spring member is positioned in the internal cavity between the first plunger member and the second plunger member. At least one cavity formed in the first plunger member with a first conductive bearing in the cavity in electrical contact with the first plunger and with the wall of the barrel member and at least one cavity formed in the second plunger member with a second conductive bearing in the cavity in electrical contact with the second plunger and with the wall of the barrel member.

A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the plunger member and the second end of the internal cavity. Three or more conductive bearings are positioned in the internal cavity in contact with the first plunger member and the spring member. A force biased spring probe pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a first plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity and a second plunger member reciprocally mounted in the internal cavity proximate the upper end of the internal cavity. A spring member is positioned in the internal cavity between the first plunger member and the second plunger member. Three or more conductive bearings are positioned in the internal cavity in contact with the first plunger member and the spring member.

A spring biased contact pin assembly includes a barrel member having a barrel wall defining an elongate internal cavity with a lower end and an upper end. The assembly also includes a lower plunger member reciprocally mounted in the internal cavity proximate the lower end of the internal cavity. A spring member is positioned in the internal cavity between the lower plunger member and the upper end of the internal cavity. A high electrical resistance spacer member is positioned in the internal cavity in contact with the lower plunger member and the spring member. Spring force exerted through the spacer member urges the lower plunger member into electrical contact with the barrel wall. A method of transmitting electricity through an electrical contact assembly includes urging a plunger member against the wall of a barrel member in which it is reciprocally mounted with a high electrical resistance member.

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Murphy, TX, United States of America

Hisashi Ata