Hitachi, Ltd.

Hisao Oodawa

Hiroshi Shojima

Takashi Saeki

Yoshiki Kobayashi

Masaya Itoh

Masanori Miyoshi

Masato Kazui

Chieko Onuma

Takao Sukegawa

Kouichi Shiraishi

The object of the invention is to provide a supervising system for image to detect a scheme at high accuracy. The supervising system for image is provided with a first portion for detecting change of time detecting the change of time in amount of feature of an image taken pictures by a image forming device, a second portion for detecting change of time in the illuminance detected by an illuminance sensor, and a scheme judging portion detecting a scheme against the image forming device in accordance with the change of time in amount of feature and the change of time in the illuminance as detected.

Supervising system for image

In order to detect abnormal objects with a low-cost arrangement at high speeds while avoiding unwanted influence of variations of a light source and/or regularly vibrating objects in the environment concerned, there is provided a block data calculation unitinputted from a camera into blocks, an object candidate extraction unitwhich compares image data of a frame to be processed and the immediately preceding frame in units of blocks to thereby extract an abnormal object candidate in accordance with the presence or absence of edges and a longitude-to-lateral edge ratio change rate, and an object judging unitfor determining or 'judging' whether the abnormal object candidate is a true abnormal object, wherein it is an abnormal object where movement of the abnormal object candidate is traceable for a prespecified length of time period.

Image monitoring method, image monitoring apparatus and storage media

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Hitachinaka, Japan

Hisao Oodawa