Renesas Electronics Corporation

Hisao Kobashi

Yasuhiko Fukushima

Mikio Asai

Shinji Kawashima

Shin Tamura

A semiconductor device includes a semiconductor substrate on which a temperature sensor is formed, a plurality of insulating films formed above the semiconductor substrate, a temperature measurement wiring pattern formed on a first insulating film which is one of the plurality of the insulating films, a detection electrode which is formed on the uppermost insulating film of the plurality of the insulating films to be arranged at a position corresponding to the first temperature measurement wiring pattern and is provided for contact a temperature measurement needle, and one or more via electrodes formed in one or more insulating film between the temperature measurement electrode and the detection electrode to couple between the temperature measurement electrode and the detection electrode.

Semiconductor device and trimming method of the same

A semiconductor device includes a logic circuit, a memory circuit having a plurality of first static memory cells formed by a transistor on the semiconductor substrate, a monitor circuit having a second static memory cell formed by a transistor on the semiconductor substrate, the monitor circuit being configured to apply stress to the second static memory cell during a period in which the semiconductor device operates so that a state of the second static memory cell can be notified, and a bus coupled with the logic circuit, the memory circuit and the monitor circuit, wherein a size of the transistor of one cell of the first static memory cells is substantively the same as that of the transistor of the second static memory cell.

Semiconductor device and method of diagnosing semiconductor device

A semiconductor device suitable for predicting failures is provided. A semiconductor device including a logic circuit and a static memory having a plurality of first static memory cells formed on a semiconductor substrate, further includes a monitor memory circuit having a second static memory cell formed on the semiconductor substrate, and a monitor circuit MON applying stress to the second static memory cell during a period in which the semiconductor device operates so that a state of the second static memory cell can be notified.

Growing community of inventors

Kodaira, Japan

Hisao Kobashi