Kabushiki Kaisha Toshiba

Tokyo Shibaura Denki Kabushiki Kaisha

Hisaaki Maiwa

Makoto Segawa

Shoji Ariizumi

Yoshihito Fukasawa

Seishi Okamoto

A test handler for a semiconductor device has a test socket for holding a semiconductor device sealed in a package, a temperature sensor for detecting the surface temperature of the package, a temperature controller for performing temperature control of the semiconductor device to set the temperature of the package detected by the temperature sensor at a predetermined temperature, and an electric characteristics measurer for applying a predetermined potential to the semiconductor device to measure electric characteristics.

Test handler for semiconductor device

A semiconductor integrated circuit having a memory and an adjacent peripheral circuit generating minority carriers which can destroy data in a portion of the memory at low temperatures. The load resistance in the portion is made lower or the storage capacity is made higher in the portion than in the remainder of the memory so that at low temperatures data is not lost and the energy consumption of the circuit is not unduly increased.

Growing community of inventors

Kawasaki, Japan

Hisaaki Maiwa