Tsinghua University

Panasonic Corporation

Hiroyuki Yamauchi

Meng-Fan Chang

Chien-Fu Chen

Jui-Jen Wu

Yoshinobu Yamagami

Ting-Hao Chang

Yen-Yao Wang

Lai-Fu Chen

A 6T static random access memory cell, array, and memory thereof are provided, in which the memory cell includes a first inverter, a second inverter, a first NMOS transistor, and a second NMOS transistor. A first high supply voltage and a low supply voltage are coupled to the first inverter. A second high supply voltage and the low supply voltage are coupled to the second inverter. The first NMOS transistor has a gate terminal coupled to a first word line. The first NMOS transistor has a source terminal coupled to the first node. The second NMOS transistor has a gate terminal coupled to a second word line, and the second NMOS transistor has a source terminal coupled to the second node. The first word line provides ON signals to turn on the first NMOS transistor, and the second high supply voltage provides a first boost voltage simultaneously.

6T static random access memory cell, array and memory thereof

A 6T static random access memory cell, array, and memory thereof are provided, in which the memory cell includes a first inverter, a second inverter, a first access transistor, and a second access transistor. A first high supply voltage and a low supply voltage are coupled to the first inverter. A second high supply voltage and the low supply voltage are coupled to the second inverter. The first access transistor has a gate terminal coupled to a first word line. The first access transistor has a source terminal coupled to the first node. The second access transistor has a gate terminal coupled to a second word line, and the second access transistor has a source terminal coupled to the second node. The first word line provides ON signals to turn on the first access transistor, and the second high supply voltage provides a first differential voltage simultaneously.

A 6T static random access memory cell, array, and memory thereof are provided, in which the memory cell includes a first inverter, a second inverter, a first access transistor, and a second access transistor. The first inverter and second inverter respectively include a first pull-up transistor, a first pull-down transistor, a second pull-up transistor and a second pull-down transistor. The first pull-down and pull-up transistors each have a drain terminal mutually coupled to form a first node. The second pull-down and pull-up transistors each have a drain terminal mutually coupled to form a second node. The first and second access transistors each have a gate terminal respectively coupled to a first word line and a second word line. When the first word line provides on signals to turn on the first access transistor, the second low voltage supply provides a first differential voltage simultaneously.

A static random access memory cell comprising a first inverter, a second inverter, a first transistor, a second transistor, and a third transistor. The first inverter is cross-coupled with the second inverter. The first transistor is connected with a write word line, a write bit line, and a first output node of the first inverter. The second transistor is connected with a complementary write bit line, the write word line, and a second output node of the second inverter. The third transistor is connected with a read bit line, a read word line, and the first input node of the first inverter to form a read port transistor, and a read port is formed. The read port transistor has a feature of asymmetric threshold voltage, and the read bit line swing can be expanded by the decrease of clamping current or the boosted read bit line.

Static random access memory cell

A semiconductor memory device, including a memory cell including a flip-flop, and a memory cell power supply circuit for supplying a cell power supply voltage to the memory cell, wherein the memory cell power supply circuit supplies a cell power supply voltage in a first period and a different cell power supply voltage in a second period.

Growing community of inventors

Fukuoka, Japan

Hiroyuki Yamauchi