Olympus Corporation

Hiroyuki Yabugaki

Tetsuya Shirota

Yasunari Matsukawa

Ryusuke Tanaka

A sampling circuit includes: a phase synchronization circuit for generating, by a phase-locked loop, an N-multiplied clock that is N times as high as the scanning frequency of a scanning position signal of a resonant scanner and is synchronized with the phase of the scanning position signal, an AD converter for AD-converting a detection signal obtained by detecting light from a sample in synchronization with the N-multiplied clock, a counter for counting the number of clocks in synchronization with the N-multiplied clock, a memory for storing a counter threshold corresponding to a desired scanning position of the resonant scanner, a comparison circuit for outputting a sampling clock in response to the counter threshold and a counter value of the counter circuit coinciding with each other, and a data processing circuit for sampling the AD-converted detection signal based on the sampling clock and generating pixel data.

Sampling circuit and laser scanning microscope

Provided is a light detecting apparatus including: a phase locked loop portion that generates a sampling clock based on a synchronization signal output from a light source that emits pulsed laser light; an A/D convertor that performs sampling of signal light output from a sample as a result of radiating the laser light thereon in accordance with the sampling clock; and a received-data processing portion that accommodates, every time N items of the sampling data are continuously acquired, the N items of data in a single data sequence. The phase locked loop portion is provided with a clock generating portion that generates a clock that has a frequency that is N times a pulse frequency of the laser light and that is synchronized with a phase of the laser light, and a delay adjusting portion that generates the sampling clock by adjusting a delay amount of the generated clock.

Light detecting apparatus and laser-scanning microscope

A microscope system includes: an microscope provided with electronic units; a display configured to display operation information; a touch panel configured to detect a position of contact of an object from outside; a setting unit configured to set areas corresponding respectively to multiple operation functions in a detection area of the touch panel; a pressure detector configured to detect a value of a pressure applied in the position of contact; and a drive controller configured to generate, based on the position of contact that is detected by the touch panel, the number of positions of contact, a change of the position of contact over time, and the value of the pressure detected by the pressure detector, an instruction signal of an instruction to change an observation status in which the specimen is observed with the electronic unit corresponding to operation function that is set by the setting unit.

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Tokyo, Japan

Hiroyuki Yabugaki