Hitachi, Ltd.

Nec Corporation

Mitsubishi Electric Corporation

Hitachi High-tech Corporation

Mitsubishi Denki Kabushiki Kaisha

Jfe Steel Corporation

The Tokyo Electric Power Company, Incorporated

Toyohashi University of Technology

Hitachi Keiyo Engineering Co., Ltd.

National Institutes for Cultural Heritage

Hiroyuki Takagi

Kazuo Takagi

Mitsuteru Inoue

Zhenlong Cui

Masaki Umayabashi

Yoshiko Tamada

Junichiro Ishikawa

Yoshitaka Naka

Hiroshi Tanaka

Akio Tajima

Osamu Yamaguchi

Tomoyuki Hino

Yasushi Nakayama

Akira Sakurai

Kenji Mizutani

Masahiro Sakauchi

Masaaki Hiroya

Ryuichi Ikematsu

Shigeki Yamakawa

Masahiro Hayashitani

Katsutoshi Satoh

Shota Morisaki

Hisashi Endo

Hisashi Endou

Minoru Suzuki

Kazuhiro Otsu

Isao Murata

Seiji Okuda

Yukihiko Wada

Taichi Goto

Tatsushi Takahashi

Soshi Narishige

Kazuhiro Nakatsuji

Masayuki Saito

Naohiko Mitomi

Taisuke Murata

Tomohiko Yao

Mitio Ishibasi

Kuninobu Ootake

Jun Imada

Hidetoshi Ueno

Kazuhiro Ootu

In a fluoroscopic image capturing apparatus, an internal structure of a specimen can be appropriately evaluated. To provide a fluoroscopic image capturing apparatusincluding: a timing control deviceconfigured to output an irradiation timing signal Sin synchronization with a drive timing signal Sfor driving a specimenor a timing signal Sas a detection result of an operation of the specimen; electromagnetic wave generation unitsandconfigured to irradiate, in synchronization with the irradiation timing signal Si, the specimenwith a pulsed electromagnetic wave beam Bhaving a wavelength with which the electromagnetic wave beam Bis transmitted through the specimen; and an electromagnetic wave detection deviceconfigured to receive the electromagnetic wave beam Btransmitted through the specimen

Fluoroscopic image capturing apparatus

A particle size distribution measurement method includes: an image acquisition step of acquiring a first CT image of a target sample including the granules; a statistical value calculation step of specifying a region of interest by dividing the acquired first CT image into predetermined grids, and calculating a first statistical value including a grid statistical value for each of the grids and an overall statistical value of the entire first CT image regarding a CT value; and a measurement step of measuring a particle size distribution of the granules in the target sample based on the first statistical value and a second statistical value including a grid statistical value and an overall statistical value of a type same as the grid statistical value and the overall statistical value included in the first statistical value in a second CT image of a standard sample including granules having a known particle size.

Particle size distribution measurement method, particle size distribution measurement device, and calculation device

A design support method capable of accurately obtaining predicted values, while also considering production conditions of a metal material, and of reducing the time required for design is provided. The design support method uses a calculator to support design of metal material with desired characteristics and includes searching for design conditions yielding the desired characteristics using a prediction model for predicting a characteristic value of the metal material from the design conditions, the prediction model being constructed based on past performance data associating the design conditions, including chemical composition and production conditions of the metal material, with the characteristic value. The design support method also includes presenting at least the chemical composition and production conditions among the design conditions that are searched for and correspond to the desired characteristics. The design conditions are searched for so that deviation among predicted values based on different training data sets is reduced.

Support method for metal material, prediction model generation method, metal material production method, and design support apparatus

A short-circuit protection circuit for a self-arc-extinguishing type semiconductor element includes a first protection circuit and a second protection circuit. The first protection circuit is configured to reduce a voltage between a control electrode and a first main electrode of the self-arc-extinguishing type semiconductor element when detecting overcurrent flowing between the first main electrode and a second main electrode. The second protection circuit is configured to: detect current flowing in an interconnection adapted to supply the drive voltage; determine, based on the detected current, whether the first protection circuit is in an operating state; and change the drive voltage to turn off the self-arc-extinguishing type semiconductor element when the first protection circuit is in the operating state.

Short-circuit protection circuit for self-arc-extinguishing type semiconductor element

A power switching apparatus includes a plurality of semiconductor switching devices connected in parallel with each other and a plurality of balance resistor units. The plurality of balance resistor units each have one end connected to a control electrode of an associated semiconductor switching device and the other end to which a common control signal is input. Each balance resistor unit is configured to have a resistance value switched between different values depending on whether the plurality of semiconductor switching devices are turned on or turned off in accordance with the control signal.

Power switching apparatus

A defect inspection device configured to measure a surface shape of an inspection target using light applied to the inspection target via a spatial light phase modulator based on an interference state of reflected light from the inspection target obtained via the spatial light phase modulator, to measure magnetic field distribution of a surface of the inspection target magnetized by an excitation device for magnetizing the inspection target using light applied to the inspection target via the spatial light phase modulator based on an interference state of reflected light from the inspection target obtained via the spatial light phase modulator, and to separate data of a magnetic field specific portion which exists on the surface of the inspection target from magnetic field distribution data which is a measurement result of magnetic field distribution of the inspection target based on surface shape data which is a measurement result of the surface shape of the inspection target, to suppress deterioration of measurement accuracy of magnetic field distribution generated by the surface shape of the inspection target and to improve defect detection accuracy.

Defect inspection device and defect inspection method

An image photography play method which is suited to playing a stereoscopic video. The image photography method includes: a step of forming a hologram pattern from a reference light and a subject light; a step of digitally processing the obtained hologram pattern; a step of writing the digitized hologram pattern as a magnetized vector pattern to a spatial lighting modulator which is formed from a magneto-optical material; and a step of inputting linearly polarized light into the spatial lighting modulator and playing an image according to the digitized hologram pattern.

Image photography method, image photography play method, spatial lighting modulator, image play device, and digital hologram forming device

Provided is an X-ray energy spectrum estimation method capable of reproducing, with high precision, information on an attenuation path to which an X-ray is irradiated, and performing, with high precision, reconstruction of an X-ray CT image by enabling high-precision estimation of spectrum of energy released from an X-ray source device. An energy spectrum estimation device () normalizes a response function, and calculates a modified efficiency matrix from the normalized response function, a detection efficiency matrix, and a measurement-system correction coefficient. The energy spectrum estimation device then calculates a particular result in accordance with a Bayesian estimation equation, without divergence, with use of the calculated modified efficiency matrix, the normalized modified efficiency matrix, and an attenuation characteristic curve obtained by a measurement circuit (). The energy spectrum () calculates an X-ray energy spectrum by dividing, by the normalized modified efficiency matrix, the particular result obtained by the Bayesian estimation equation.

X-ray energy spectrum measurement method, X-ray energy spectrum measurement apparatus, and X-ray CT apparatus

Provided are an inspection device and an inspection method capable of achieving improved magnetic field sensitivity by using a magnetic thin film of a small film thickness. A light-emitting unitemits light of a first wavelength for acquiring magnetic field inspection information and a second wavelength for acquiring inspection object surface information. A selection unitselects information from an inspection objectand information from a magnetophotonic crystal filmacquired by light irradiation performed by an irradiation unit. An image generation unitgenerates image data based on the magnetic field inspection information acquired with the first wavelength and the inspection object surface information acquired with the second wavelength selected by the selection unit. Each of the generated image data is displayed on a display unit

Inspection device and inspection method

In order to realize a multiplexer/demultiplexer in which utilization efficiency of a frequency is high, wavelength characteristics of a transmission band is flat, the cost is low, the size is small, and a wavelength and a band are variable, the multiplexer/demultiplexer includes: first light branching means for branching inputted light into plurality of pieces of light and outputting the branched pieces of light; a plurality of light wavelength separating means for separating and outputting light outputted from the first light branching means for each of predetermined frequency bands; and an optical coupling means for making outputs having frequency bands different from each other among outputs from the light wavelength separating means gather and be outputted.

Multiplexer/demultiplexer and multiplexing/demultiplexing method

A node according to the present invention is used in an MPLS (Multi Protocol Label Switching) network, and the node includes an input unit which receives an OAM (Operation Administration and Maintenance) frame including TTL (Time To Live) from outside of the node and an output unit which transmits an OAM frame to outside of the node, wherein the input unit sets the TTL to a specific value and transmits the received OAM frame to the output unit in case a termination destination which an OAM frame received from outside indicates is the node and the received OAM frame is to be transmitted to the output unit and the output unit terminates an OAM frame transmitted from the input unit.

Node, a monitoring management method used for a node, and a transfer system, an input circuit and an output circuit

An inspection signal to inspect forward-path or return-path communication, is transmitted from a reference node of a network. A response signal is transmitted in a priority class from a node of a forward path to the reference node. In the case of inspection of return-path communication, a replica of the response signal is transmitted in a non-priority class from the node of the forward path to the return path, and the node that receives the replica of the response signal transfers the replica in a priority class to the reference node. In the case of inspection of forward-path communication, a replica of the inspection signal is transmitted in a non-priority class from the node of the forward path to the forward path, and a replica of the response signal is transmitted in a priority class from the node that receives a replica of the inspection signal to the reference node.

Congestion detecting method and communication node

An exemplary object of the present invention lies in a point of providing a technology capable of measuring a transmission quality of an Ethernet network in order to utilize Ethernet as carrier-grade communication. The present invention includes an error bit number measurer for measuring the number of error bits that have occurred for a frame of Ethernet, being a target of monitoring, within a monitoring period, a transmitted bit number measurer for measuring the number of total transmitted bits of Ethernet frames that a device facing it has transmitted within the foregoing monitoring period, and a bit error rate operator for obtaining a bit error rate of a transmission path by employing a measurement result by the foregoing error bit number measurer and the foregoing transmitted bit number measurer.

Quality measuring system, quality measuring apparatus, quality measuring method, and program

The present invention provides a computed tomography system that only requires rotational scans for image pickup, the system enabling images of a plurality of testing objects to be simultaneously picked up without increasing the volume of noise or the scale of the system, thus enabling high-quality tomographic images to be efficiently picked up. In the computed tomography system, a plurality of turn tablestoare provided in a region of irradiation with X-ray beams emitted by an X-ray irradiation system. Testing objects Ma to Md are placed on the respective turn tables. Images of the plurality of testing objects can be simultaneously picked up by irradiation with X-ray beams. This enables precise image pickup to be efficiently achieved without increasing the size of the scale.

Computed tomography system

A decarbonating apparatus has a dehumidifying section for adsorbing humidity contained in waste gas and a decarbonating section for adsorbing CO contained in the dehumidified waste gas. The decarbonating section includes a decarbonating drum rotor loaded with a CO adsorbent having a honeycomb structure and arranged so as to adsorb CO contained in the waste gas, a heated gas supply pipe for supplying a heated gas so as to desorb CO adsorbed by the CO adsorbent, a purge gas supply pipe for supplying a purge gas so as to purge desorbed CO , and a cooling gas supply pipe for supplying a cooling gas so as to regenerate the CO adsorbent. The decarbonating drum rotor is rotated to successively pass through the adsorption region, the desorption region, the purging region, and the regeneration region.

Method for decarbonating waste gas and decarbonating apparatus

Growing community of inventors

Tokyo, Japan

Hiroyuki Takagi