Adv Antest Corporation

Hiroyuki Mineo

Atsunori Shibuya

Natsuki Shiota

Toru Murakami

Hiromitsu Takasu

Ju Hwan Yoo

An electronic component testing apparatus for testing a device under test (DUT) includes: a socket unit that is electrically connected to the DUT; a first wiring board that includes a board opening; and a tester that includes a test head in which the first wiring board is mounted. The socket unit includes a first socket that faces a first main surface of the DUT and is electrically connected to the DUT and the first wiring board. The second socket that is exposed from the first wiring board through the board opening, contacts a second main surface of the DUT on a side opposite to the first main surface, and includes: a base that contacts the second main surface; and a test antenna unit that is electrically connected to the tester and faces a device antenna unit of the DUT.

Electronic component testing apparatus, sockets, and replacement parts for electronic component testing apparatus

An electronic component testing apparatus is used for testing a device under test (DUT). The electronic component testing apparatus includes: a socket unit that is electrically connected to the DUT; a first wiring board; and a tester that comprises a test head in which the first wiring board is mounted. The socket unit includes a first socket and a second socket. The second socket includes a base and a test antenna unit. The tester tests the DUT by transmitting and receiving radio waves between a device antenna unit of the DUT and the test antenna unit while the DUT is electrically connected to the first socket and the first socket is electrically connected to the test head through the second socket.

A test section unit provided to a test head body includes a plurality of sockets to be attached with electronic devices to be tested and a performance board as a main substrate. All of the sockets are provided with the performance board without an intervening a socket board.

Test section unit, test head and electronic device testing apparatus

A performance board able to secure low loss, low reflection, stable transmission characteristics even when using a high frequency signal to test an electronic device and able to suppress signal leakage to the outside and entry of noise, provided with a base board having a signal pattern electrically connected with a socket formed on its front surface, a coaxial connector to which a coaxial cable electrically connecting the performance board and test apparatus is connected, passing through the base board from the back surface toward the front surface, and having a front exposed part of the center contact bent and electrically connected to the signal pattern, and a cover member covering the front exposed part of the center contact and correcting the impedance of the front exposed part.

Measuring board for electronic device test apparatus

In a connector housing blockcomprising an interface memberfor electrically connecting a test head bodywith socketsin an electronic device testing apparatus, a connector housingprovided with a plurality of connector pinsin a non-floating state is attached to a block basein a floating state via a coil spring. Due to the configuration, the number of parts of the connector housingcan be reduced, mounting density of the connector pinscan be improved, and a positional error of the connector housingcan be absorbed.

Connector housing block, interface member and electronic device testing apparatus

Measurement board for electronic device test apparatus

There is provided a semiconductor testing apparatus having a test head body having signal modules for processing the test signals, a plurality of connection cables electrically connected with the signal module and having connector pins at their ends, a plurality of types of connector housings for holding a plurality of connector pins, an interface plate having a plate body disposed on one face of the test head body and a plurality of connector blocks removably attached respectively to the plate body while storing a plural number of connector housings of either type among the plurality of types and a performance board for removably holding the electronic device and for electrically connecting the plurality of connector pins to the electronic device by being attached to the interface plate.

Growing community of inventors

Tokyo, Japan

Hiroyuki Mineo