Fujitsu Corporation

Hiroyuki Kudou

Naoki Aihara

Nobuhiko Eguchi

Kazumasa Sonoda

A method of testing an ATM exchange having a redundant structure that includes an active system and a standby system includes the steps of transmitting a test cell from a testing device to both the active system and standby system, causing the test cell to pass through ATM switches in each of the active and standby systems, returning the test cell that has passed through the ATM switches of both systems to the testing device, and conducting a test of the ACT switches in the active and standby systems by comparing data contained in the transmitted test cell with data contained in a test cell received from the active system or standby system.

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Fukuoka, Japan

Hiroyuki Kudou