Enplas Corporation

Hiroyuki Ichikawa

A contact probe that includes a tubular structure, an engagement part and an elastic member. The elastic member is received within the tubular structure; the engagement part is arranged within the tubular structure; a part of the elastic member is arranged in the tubular structure, a first end of the elastic member is engaged with the engagement part, the elastic member abuts closely against an inner wall of the tubular structure, and a part of the tubular structure abutting against the elastic member has at least two contact surfaces. During installation, the first end of the elastic member is engaged with the engagement part of the tubular structure. At this time, the elastic member abuts closely against the inner wall of the tubular structure, and the part of the elastic member abutting against the tubular structure has at least two contact surfaces. Since there are stable contact surfaces between the elastic member and the tubular structure, the elastic member can always contact with at least two contact surfaces of the tubular structure when the elastic member is bent, thereby improving the stability of the structures within the contact probe and improving the stability of electrical testing.

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Kawaguchi, Japan

Hiroyuki Ichikawa