Kabushiki Kaisha Toshiba

Toshiba Energy Systems & Solutions Corporation

Hiroya Ichikawa

Masahiro Yoshida

Akira Ito

Itaru Chida

Souichi Ueno

Katsunori Shiihara

Takeshi Maehara

Shigeki Maruyama

Jun Semboshi

Setsu Yamamoto

Noriyasu Kobayashi

Kota Nomura

Takashi Kasuya

Tatsuya Oodake

Keiichi Hirota

Yuji Sano

Makoto Ochiai

Akihiro Tsuji

Naotaka Suganuma

Kazuki Kora

Yasuaki Tokunaga

Yuko Kitajima

A laser peening device includes: a laser oscillator; an irradiation nozzle for irradiating a laser beam onto an irradiation target; an optical transmission unit; a shutter attached to the optical transmission unit; a liquid feeder for supplying the irradiation nozzle with liquid to cause the liquid to flow along an optical path of the laser beam running from the irradiation nozzle to the irradiation target; an ongoing irradiation sensor for obtaining information on ongoing laser beam irradiation indicating whether the laser beam is being appropriately irradiated for execution of ongoing laser peening operation on the irradiation target; and a control unit controlling the shutter according to the information on the ongoing laser beam irradiation obtained by the ongoing irradiation sensor.

Laser peening device and laser peening method

One embodiment of the laser processing apparatus is for surface treatment by supplying liquid to a surface of the target member and irradiating pulsed laser light to the surface of the target member via the liquid. The apparatus includes a laser oscillator and a liquid supply. The laser oscillator irradiates the laser light to the surface through the liquid via an optical window. The liquid supply is configured to supply the liquid to the surface of the target member via a flow path passing on an outer surface of the optical window. When the liquid is in contact with a laser light emission surface of the optical window, the laser light emission surface transmits the laser light. When the liquid is not in contact with the laser light emission surface, the laser light emission surface reflects the laser light.

Laser processing apparatus and laser processing method

An eddy-current flaw detector includes a trace data calculator configured to calculate each coordinate with respect to flaw detection points on which an inspection probe is used upon performing an eddy-current testing based on an inputted condition of eddy-current flaw detection and surface shape data of an inspection-object surface measured by a profilometer, and to calculate a normal vector of each flaw detection point; a gap evaluation calculator configured to acquire an evaluation result on a gap between the inspection-object surface and the inspection probe for each flaw detection point; a flaw detection data collector configured to acquire flaw detection data of an inspection object for each flaw detection point; a flaw detection data analyzer configured to evaluate presence/absence of a flaw in the inspection-object surface based on the flaw detection data of the inspection object and the evaluation result on the gap for each flaw detection point.

Eddy-current flaw detector and eddy-current flaw detection method

An embodiment is to provide a laser light irradiation apparatus and a laser peening treatment method, by which even a member to be processed, existing in a narrow portion, can be easily processed by laser peening. The laser light irradiation apparatusaccording to the embodiment includes: an optical fiberthrough which laser light is guided; a condensing lensthat is placed on one end of the optical fiber, the condensing lens and the optical fiber defining the light path of the laser light; a guidethat retains the optical fiber; and a movement mechanismfor changing the position of the optical fiber, wherein the light path of the laser light guided through the optical fiber is emitted at an angle changed to more than 0&#xb0; and less than 90&#xb0; with respect to the central axis of the optical fiber by the condensing lens.

Laser light irradiation apparatus and laser peening treatment method

There is provided an eddy current flaw detection technique capable of, even when inspecting an object having a narrow portion with a small curvature radius, recognizing detection sensitivity change due to change of attitude of a probe. An eddy current flaw detection apparatusincludes: an AC power sourcewhich generates an excitation magnetic field in each of excitation coilsaccommodated in a probeto excite an eddy current in an inspection object; a detecting sectionwhich detects a detection signal generated by an induction magnetic field induced by the eddy current in each of detection coilsaccommodated in the probe; an output sectionwhich outputs flaw detection data based on the detection signals; a storage sectionwhich mutually associates and stores the detection signals detected at the same timing from the plurality of coils; and an evaluating sectionwhich evaluates an attitude of the probebased on the plurality of detection signals detected at the same timing and associated with each other.

Eddy current flaw detection device, eddy current flaw detection method, and eddy current flaw detection program

A laser irradiation device in which laser light is adjusted to create a laser beam, including a protective glass window arranged in an emission region that emits the laser beam; a reflection mechanism that passes the laser beam and reflects visible light; a wavelength-dependent optical screening mechanism that cuts off light of a wavelength region other than visible light from the light that is reflected by the reflection mechanism; image pickup camera configured to capture the visible light reflected with the reflection optical element; and an image adjustment lens unit that adjusts an image in the visible light that is input from the wavelength-dependent optical screening mechanism. The wavelength-dependent optical screening mechanism is provided between the reflection optical element and the image camera.

Laser irradiation device and method of diagnosing the health of a laser irradiation head

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Yokohama, Japan

Hiroya Ichikawa