Olympus Corporation

Olympus Optical Company, Ltd.

Hiroya Fukuyama

Tadashi Hirata

Takehiro Yoshida

Tatsuo Nagasaki

Toshihiro Kitahara

Yoshihiro Kawano

Hideto Yamashita

Susumu Kikuchi

Hidetoshi Yamada

Shinichi Takimoto

Kenji Taira

Ryosuke Ito

Mamoru Hasegawa

Shingo Kashima

Hideyuki Takaoka

Hiroyuki Nishida

Yoshihisa Tanikawa

Hisao Kitagawa

Ken Fujinuma

Kazuhisa Karaki

Seiya Takahashi

Mitsunori Yamamoto

Toshiharu Narita

The disclosed technology is directed to placing two galvanometer mirrors in a pupil conjugate relationship and at the same time preventing astigmatism from occurring while preventing images from being degraded by flaws and foreign matter on a lens. A scanning optical system includes two one-dimensional scanning means disposed closely to each other at a spaced interval therebetween in an optical axis direction for scanning a light beam from a light source in two scanning directions. An objective lens for focusing the light beam scanned by the scanning means onto a target. A plurality of optical elements is disposed in positions spaced from an intermediate image plane in the optical axis direction and having different optical powers in the two scanning directions. The positions and the optical powers of the respective optical elements are set to compensate for the spaced interval between the two scanning means in the optical axis direction.

Scanning optical system and observation apparatus

In an optical fiber scanning apparatus, an optical fiber to which a permanent magnet is disposed and which is configured to emit illumination light from a distal end portion is arranged in a hollow portion where a magnetic field generation unit is disposed of a frame body, the frame body for which a cross section of the hollow portion is a square includes a first frame body for which planar coils are disposed respectively on a first surface and a second surface that are orthogonal to each other, and a second frame body for which planar coils are disposed respectively on a third surface and a fourth surface that are orthogonal to each other, and which is bonded with the first frame body, and the first surface to the fourth surface configure inner surfaces of the hollow portion.

Optical fiber scanning apparatus and optical scanning type endoscope

The imaging optical system is for acquiring a clear final image, even if an intermediate image is formed at a position that overlaps with an optical device, by preventing scratches or the like of the optical device from becoming superimposed on the intermediate image, and has imaging lenses that form a final image and at least one intermediate image, a first phase-modulating element that imparts a spatial disturbance to a wavefront of light from an object, and a second phase-modulating element disposed at a position so that at least one intermediate image is interposed between the element and the element and that cancels the spatial disturbance, wherein the element has cylindrical lenses arranged with a space therebetween, and arranged so that a principal point of the whole system is positioned in a vicinity of a pupil position of the imaging lenses.

Imaging optical system, illumination apparatus, observation apparatus, and wavefront recovery device

Provided is a microscope apparatus including: a light source; an illumination optical system that radiates illumination light from the light source onto an observation object; an imaging optical system that focuses light from the observation object; and an image acquisition device that acquires an image of the light focused by the imaging optical system. The imaging optical system is provided with: imaging lenses that form a final image and at least one intermediate image; a first phase modulation element that is disposed closer to an object than any of the at least one intermediate image and that gives a spatial disturbance to the wavefront of light from the object; a second phase modulation element that is disposed at a position for allowing the at least one intermediate image to be sandwiched with the first phase modulation element and that cancels out the spatial disturbance given to the wavefront.

Pair of phase modulation elements for imaging optical system, imaging optical system, illuminating device, and microscope apparatus

Acquiring a sharp final image by preventing, even when an intermediate image is formed at a position overlapping an optical element, a flaw or the like on the optical element from being superimposed on the intermediate image. An observation apparatus including: an image-forming optical system having image-forming lenses that form a final image and an intermediate image, a first phase modulator that applies a spatial disturbance to the wavefront of light, and a second phase modulator that cancels out the spatial disturbance; a light source; an XY-scanning part including a first and a second scanner; and a photodetector. The two phase modulators are disposed at positions optically conjugate with the first scanner and have one-dimensional phase-distribution characteristics changing in the scanning direction of the illumination light.

Observation apparatus and method for sharpening final image

An image-forming optical system includes a plurality of image-forming lenses that form a final image and at least one intermediate image; a first phase modulator that is disposed closer to an object side than any one of the intermediate images formed by the image-forming lenses and that applies a spatial disturbance to a wavefront of light coming from the object; and a second phase modulator that is disposed at a position that sandwiches at least one of the intermediate images with the first phase modulator and that cancels out the spatial disturbance applied to the wavefront of the light coming from the object by the first phase modulator.

Image-forming optical system, illumination apparatus, and observation apparatus

A high-resolution fluorescence image in which an afterimage is suppressed is obtained, even when a fluorescence detection interval is shortened. Provided is a scanning observation apparatus including a scanning unit that spatially scans pulsed excitation light emitted from a light source at prescribed time intervals on a specimen; a fluorescence detecting unit that detects fluorescence generated by exciting a fluorescent substance inside the specimen with the excitation light scanned by the scanning unit, in synchronization with the emission of the excitation light; and a fluorescence correcting unit that subtracts, from a fluorescence intensity detected by the fluorescence detecting unit, an afterimage fluorescence component calculated on the basis of time-sequential fluorescence detected by the fluorescence detecting unit prior thereto, at each scanning position, to correct the fluorescence intensity at the scanning position.

Scanning observation apparatus

There is provided an inside observation apparatus of an endoscope and the like which can perform an inside observation for irradiating an illumination light to a minute area of a surface of an object (for example, a living tissue) having a light scattering property and detecting a back-scattered light of the illumination light, can increase a detected light amount by a simply and low cost configuration by making an area of a detection region larger than an illumination region, and can reduce a time necessary to detect an body (for example, a blood vessel) to be observed and detect a region deeper than a conventional region.

Internal observation device for object having light scattering properties, internal body observation device, endoscope for internal observation and internal observation method

High-precision observation is made possible while allowing contact between a distal end of an objective lens and an optical element without damaging the distal end of the objective lens and the optical element even when attaching to and detaching from the distal end of the objective lens. Provided is an objective lens adapter including a fixed member that is fixed to a lens tube of an objective lens, a distal-end member including an optical element that is made to be placed in contact with the distal-end surface of the objective lens, and an elastic member that is disposed between the distal-end member and the fixed member and that urges the optical element in a direction that causes the optical element to contact the distal-end surface of the objective lens.

Objective lens adapter

There is provided a lighting system having a high spatial resolution appropriate to a high-frequency component by evanescent waves in a negative refraction lens. The lighting system includes a light emitter thin film () which includes a light emitting material which emits light when an energy is applied, a cathode () for applying an electron beam () which is the energy, to the light emitter thin film (), and a negative refraction lens () which is formed of a material exhibiting negative refraction, and has an optical system for projecting light emitted from the light emitter thin film (), on an object.

Lighting system, method of lighting, optical detector, and method of optical detection

Light emitter excitation light () of a wavelength &#x3bb;emitted by a light source () is collected on a light emitter () by a collective lens (). The light emitter () is held on a substrate (), and emits fluorescent light of a wavelength &#x3bb;when the light emitter excitation light () of the wavelength &#x3bb;is irradiated. A diameter of the light emitter () being formed to be smaller than the wavelength &#x3bb;, this fluorescent light includes evanescent waves, and advances through the substrate () as an object illuminating light () having the light emitter () as a point light source. A negative refraction lens () is disposed such that an image of the light emitter () is formed on a surface of an object, and accordingly, not only a propagating-light component included but also a evanescent-wave component in the object illuminating light () is also collected simultaneously, and a minute beam spot of a size almost same as of the light emitter () is formed on the surface of the object ().

Light emitting type lighting system, method of light emitting type lighting, and scanning optical microscope

A microscope examination apparatus including a light source; an illumination optical system configured to guide light from the light source to a specimen; an objective lens configured to collimate return light from the specimen, the objective lens being provided in such a manner as to be displaceable at least in a direction intersecting an optical axis of the objective lens; an image-forming lens configured to image the return light from the specimen, which is collimated by the objective lens; an optical detector configured to detect the return light imaged by the image-forming lens; a microscope main body including the image-forming lens and the optical detector; and an objective-lens driving mechanism configured to drive the objective lens in a direction correcting image blur due to a displacement of the specimen.

Microscope examination apparatus

The present invention enables switching between wide-field observation and high-magnification observation during in vivo examination of a small laboratory animal or the like using a narrow-diameter objective lens, without changing the objective lens. There is provided a microscope optical system including an objective lens for collecting light from an examination target; an image-forming lens for imaging the light collected by the objective lens onto a detection device; and an auxiliary optical system, having positive power, which is provided so as to be capable of being inserted in and removed from a light path between the objective lens and the image-forming lens.

Microscope optical system, microscope apparatus, and microscope observation method

The present invention makes an objective lens easier to handle during disinfection or sterilization and protects the objective lens during, for example, transport, storage, or handling. The present invention provides an objective-lens protector including a substantially ring-shaped mounting portion surrounding a circumference of an objective lens, the mounting portion detachably mounted on the objective lens such that a threaded mount formed on the objective lens for mounting the objective lens to a microscope main body is exposed; a protecting member fixed to the mounting portion, extending substantially along the entire length of the objective lens mounted on the mounting portion, and arranged at a distance outwardly in a radial direction of the objective lens so as to surround the objective lens; and a locking mechanism provided on the mounting portion to prevent the objective lens from moving relative to the mounting portion in a circumferential direction.

Objective-lens protector, objective-lens treatment method, and objective-lens cleaner

A microscope system includes a light source and an objective unit. The objective unit includes an objective optical system, including a small-diameter distal optical system arranged at an end brought near to or into contact with a specimen, for focusing light from the light source onto the specimen; a threaded mount at a coupling position; and an outer cylinder enclosing the small-diameter distal optical system. The microscope system further includes an imaging optical system for forming an image of light from the specimen through the objective optical system and a microscope main body for housing the imaging optical system. The objective unit is detachable from and attachable to the microscope main body with the threaded mount. Conditional expression Df/Da&#x2266;0.3 is satisfied, where Df represents the outer diameter of the outer cylinder and Da represents the outer diameter of the threaded mount.

Growing community of inventors

Machida, Japan

Hiroya Fukuyama