Sony Corporation

Hitachi, Ltd.

Sony Group Corporation

Hitachi-high-technologies Corporation

Hiroto Kasai

Takeshi Yamasaki

Tatsumi Ito

Masataka Shinoda

Shoji Akiyama

Gakuji Hashimoto

Yuji Akiyama

Masaya Kakuta

Ken Harada

Takayuki Kato

Yutaka Saito

Hirokazu Tamaki

Hidetaka Okamoto

Kouhei Hatamoto

Kenta Mukai

Hiroyuki Kobayashi

Yutaka Kaneko

Isao Ichimura

Yoshio Takahashi

Makoto Hashimoto

Fumitaka Otsuka

Yoshifumi Taniguchi

Yuichi Aki

Takashi Miyata

Toshie Yaguchi

Takaho Yoshida

Ayumu Taguchi

Keiji Tamura

Takafumi Yotsuji

Tatsuya Minakawa

Keiichi Maeda

Orifice part for flow cytometer

Micro flow channel chip

An electron microscope for observation by illuminating an electron beam on a specimen, includes: an edge element disposed in a diffraction plane where a direct beam not diffracted by but transmitted through the specimen converges or a plane equivalent to the diffraction plane; and a control unit for controlling the electron beam or the edge element. The edge element includes a blocking portion for blocking the electron beam, and an aperture for allowing the passage of the electron beam. The aperture is defined by an edge of the blocking portion in a manner that the edge surrounds a convergence point of the direct beam in the diffraction plane. The control unit varies contrast of an observation image by shifting, relative to the edge, the convergence point of the direct beam along the edge while maintaining a predetermined distance between the convergence point of the direct beam and the edge.

Electron microscope and imaging method

The present disclosure provides a particle sorting apparatus, a particle sorting method, and a non-transitory computer-readable storage medium storing program that enable sorting object particles to be sorted with high precision, even when the sorting object particles are large. In the particle sorting apparatus, a charging unit that applies charges to at least a part of liquid droplets ejected from an orifice to generate a fluid stream and a charging control unit that adjusts a charge application end time in the charging unit according to sizes of particles included in the liquid droplets are provided.

Particle sorting apparatus and particle sorting method

Particle sorting apparatus, particle sorting method, and non-transitory computer-readable storage medium storing program

Micro flow channel chip for a flow cytometer

Micro flow channel chip for flow cytometer

Provided is a phase plate for use in an electron microscope which lessens the problem of image information loss caused by interruption of an electron beam and ameliorates the problem of anisotropic potential distributions. This phase plate comprises openings () connected into a single opening, and multiple electrodes () arranged in the opening from the outer portion of the opening towards the center of the opening. The cross sections of the electrodes () are configured such that a voltage application layer () comprising a conductor or a semiconductor is covered by a shield layer comprising a conductor or a semiconductor with an intermediate insulating layer. By this means, this phase plate is capable of lessening electron beam interruption due to the electrodes (), and of ameliorating the problem of anisotropic potential distributions.

Phase plate and electron microscope

There is a limit in range and distance in which an electron beam can interfere and electron interference is implemented within a range of a coherence length. Therefore, interference images are consecutively recorded for each interference region width from an interference image of a reference wave and an observation region adjacent to the reference wave by considering that a phase distribution regenerated and observed by an interference microscopy is a differential between phase distributions of two waves used for interference and a differential image between phase distributions of a predetermined observation region and a predetermined reference wave is acquired by acquiring integrating phase distributions acquired by individually regenerating the interference images. This work enables a wide range of interference image which is more than a coherence length by arranging phase distribution images performed and acquired in the respective phase distributions in a predetermined order.

Electron beam interference device and electron beam interferometry

An electron beam observation device includes a mechanism which disposes a specimen at an upstream side in an electron beam traveling direction outside an objective lens, from which an image is transferred under a magnification of &#x2155; to 1/30, in addition to an inside of the objective lens in which a specimen is disposed at a time of ordinary observation.

Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation method

A multi-biprism electron interferometer is configured so as to arrange a plurality of biprisms in an imaging optical system of a specimen. An upper electron biprism is arranged upstream of the specimen in the traveling direction of the electron beam, and an image of the electron biprism is formed on the specimen (object plane) using an imaging action of a pre-field of the objective lens. A double-biprism interference optical system is constructed of a lower electron biprism disposed downstream of the objective lens up to the first image plane of the specimen.

Electron beam device

In electron holography observation using a transmission electron microscope, searching of conditions of an electron optical condition which are necessary for realizing a requested spatial resolution is sophisticated and for persons unaccustomed to operation of the electron microscope, the observation is time consuming work. In addition to the fundamental electron microscope proper, an input unit for inputting a spatial resolution requested in the holography observation, a calculation unit for calculating positions of electron biprism and specimen necessary for realizing the requested spatial resolution from the inputted value and parameters characteristic of the device and mechanisms for moving the two positions for realizing the obtained calculation results are provided.

Electron holography system

Growing community of inventors

Tokyo, Japan

Hiroto Kasai