Adv Antest Corporation

Molex Japan Co., Ltd.

Hirotaka Wagata

Akinori Mizumura

Yoshikazu Nakayama

Ryo Uesaka

Jun Watanabe

Hiroyuki Hama

Shin Sakiyama

Minoru Iida

Teruhito Suzuki

Hiroyuki Yajima

To provide a connector wherein ground terminals can be designed easily, which not only suppresses the occurrence of impedance mismatch and crosstalk, but which does not lead to interferences between contacting portions. A ground terminal for a connector has a cylindrical main body. A plurality of contacting portions, for contacting a circuit board, are formed on the bottom edge of the cylindrical main body. The ground terminal has, as contacting portions, inner contacting portions and outer contacting portions. The inner contacting portions extend toward the inside of the cylindrical main body and in the downward direction, and the outer contacting portions extend toward the inside of the cylindrical main body and in the downward direction.

Connector and semiconductor testing device having the same

A connector includes a signal terminal, an insulating member, a ground terminal and an enclosure. The signal terminal has a main body extending in one direction, and a contact arm provided on each side of the main body for contacting another conductor. The insulating member encloses the main body. The ground terminal has a cylindrical main body enclosing the insulating member, and a contact arm provided on each side of the cylindrical main body for contacting another conductor. The cylindrical main body includes first and second semi-cylindrical parts, each having semi cylindrical shapes. The semi-cylindrical parts make a cylindrical shape as a whole by both end parts of the circumferential direction being assembled so as to mutually overlap. An insertion hole is formed in the enclosure where an assembly of the signal element, the insulating member and the ground terminal are inserted.

Connector and semiconductor test device

A ground terminal has a cylindrical main body. A signal terminal has a terminal main body that is disposed on the inside of the cylindrical main body, and a connecting plate portion that extends from an end portion of the terminal main body. Additionally, a ground terminal has at least three connecting plate portions that are disposed so as to encompass the connecting plate portion of the ground terminal, each extending from mutually different positions on an edge of the cylindrical main body.

Connector and semiconductor testing device using the same

A multi-port device analysis apparatus is capable of analyzing a multi-port device having three or more with improved efficiency and accuracy. The multi-port device analysis apparatus includes: a signal source () for providing a test signal to one of terminals of a multi-port device under test (DUT); a plurality of test ports (P-Pn) for connecting all of the terminals of the multi-port DUT to the corresponding test ports; a plurality of measurement units (MU-MUn) for measuring signals from the corresponding test ports; a reference signal measurement unit (R) for measuring the test signal for obtaining reference data; a plurality of terminal resistors (TR-TRn) each being assigned to one of the test ports; and switch means (SW-SWn) for selectively providing the test signal to one of the test ports (input port) and disconnecting the terminal resistor from the input port while connecting the terminal resistors to all the other test ports; wherein parameters of the multi-port DUT are acquired without changing the connections between the test ports and the terminals of the DUT, while changing selection of the test port until all of the test port being assigned as the input port.

Multi-port analysis apparatus and method and calibration method thereof

A multi-port device analysis apparatus is capable of analyzing a multi-port device having three or more with improved efficiency and accuracy. The multi-port device analysis apparatus includes: a signal source for providing a test signal to one of terminals of a multi-port device under test (DUT); a plurality of test ports for connecting all of the terminals of the multi-port DUT to the corresponding test ports; a plurality of measurement units for measuring signals from the corresponding test ports; a reference signal measurement unit for measuring the test signal for obtaining reference data; a plurality of terminal resistors each being assigned to one of the test ports; and switch means for selectively providing the test signal to one of the test ports (input port) and disconnecting the terminal resistor from the input port while connecting the terminal resistors to all the other test ports; wherein parameters of the multiport DUT are acquired without changing the connections between the test ports and the terminals of the DUT, while changing selection of the test port until all of the test port being assigned as the input port.

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Tokyo, Japan

Hirotaka Wagata