Hokkaido University

Other

National Institute of Advanced Industrial Science and Technology

Mitsumi Electric Company Ltd.

Japan Science and Technology Agency

Semicon Craft Technologies

Hirotaka Hosoi

Koichi Mukasa

Kazuhisa Sueoka

Makoto Sawamura

Seiji Takeda

Atsushi Ishii

Kazuhiko Matsumoto

Motonori Nakamura

Yoshihiro Sakoda

Hiroshi Kida

Satoshi Hattori

Yoshiki Yamada

Hiroichi Ozaki

Agus Subagyo

Michiya Kimura

Naoki Kamo

A high-sensitivity field effect transistor using as a channel ultrafine fiber elements such as carbon nanotube, and a biosensor using it. The field effect transistor comprises a substrate, a source electrode and a drain electrode arranged on the substrate, a channel for electrically connecting the source electrode with the drain electrode, and a gate electrode causing polarization due to the movement of free electrons in the substrate. For example, the substrate has a support substrate consisting of semiconductor or metal, a first insulating film formed on a first surface of the support substrate, and a second insulating film formed on a second surface of the support substrate, the source electrode, the drain electrode, and the channel arranged on the first insulating film, the gate electrode disposed on the second insulating film.

Biosensor having ultra fine fiber

A single-electron transistor comprising at least a substrate, a source electrode and a drain electrode formed on top of the substrate opposing to each other, and a channel arranged between the source electrode is disclosed wherein the channel is composed of ultra fine fibers. By having such a constitution, a sensor can have excellent sensitivity.

Single-electron transistor, field-effect transistor, sensor, method for producing sensor, and sensing method

A probe for measuring a leakage magnetic field includes a substrate, a flexible cantilever having one end fixed to the substrate and a free end, and at least one magneto resistive element arranged on the free end of the cantilever. The magneto resistive element has a width within a range from 10 nm to 1 &mgr;m as measured in a direction perpendicular to a longitudinal direction of the cantilever and in a direction in which the cantilever can be deflected.

Probe having at least one magnetic resistive element for measuring leakage magnetic field

At the forefront of a probe is formed a carbon nanotube having an armchair type crystal structure or of which the forefront is chemically modified with modifying molecules.

Scanning probe microscope

Growing community of inventors

Sapporo, Japan

Hirotaka Hosoi