Growing community of inventors

Tokyo, Japan

Hiroshige Fujii

Average Co-Inventor Count = 2.61

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 133

Hiroshige FujiiYukihito Oowaki (5 patents)Hiroshige FujiiMasatoshi Sekine (5 patents)Hiroshige FujiiKazunori Ohuchi (2 patents)Hiroshige FujiiHideo Shimizu (1 patent)Hiroshige FujiiAtsushi Masuda (1 patent)Hiroshige FujiiTakehisa Kato (1 patent)Hiroshige FujiiToshihiko Himeno (1 patent)Hiroshige FujiiMasako Yoshida (1 patent)Hiroshige FujiiNaoki Endo (1 patent)Hiroshige FujiiFujio Ishihara (1 patent)Hiroshige FujiiHiroaki Nishi (1 patent)Hiroshige FujiiRyubi Okuda (1 patent)Hiroshige FujiiMotoki Tokumasu (1 patent)Hiroshige FujiiHiroshige Fujii (8 patents)Yukihito OowakiYukihito Oowaki (79 patents)Masatoshi SekineMasatoshi Sekine (13 patents)Kazunori OhuchiKazunori Ohuchi (33 patents)Hideo ShimizuHideo Shimizu (68 patents)Atsushi MasudaAtsushi Masuda (34 patents)Takehisa KatoTakehisa Kato (21 patents)Toshihiko HimenoToshihiko Himeno (20 patents)Masako YoshidaMasako Yoshida (10 patents)Naoki EndoNaoki Endo (8 patents)Fujio IshiharaFujio Ishihara (7 patents)Hiroaki NishiHiroaki Nishi (7 patents)Ryubi OkudaRyubi Okuda (2 patents)Motoki TokumasuMotoki Tokumasu (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Kabushiki Kaisha Toshiba (8 from 52,751 patents)


8 patents:

1. 7685552 - Semiconductor integrated circuit device having clock buffers and method for arranging the clock buffers on the device

2. 6617902 - Semiconductor memory and holding device

3. 6393521 - Information processing apparatus

4. 6349395 - Configurable integrated circuit and method of testing the same

5. 6327654 - Semiconductor integrated circuit for cryptographic process and encryption algorithm alternating method

6. 6157997 - Processor and information processing apparatus with a reconfigurable

7. 6112163 - Semiconductor integrated circuit and test method therefor

8. 6026480 - Processor having bug avoidance function and method for avoiding bug in

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