Canon Kabushiki Kaisha

Intermetallics Co., Ltd.

Hiroshi Watanabe

Hiroyuki Hagiwara

Shojiro Yamazaki

Masato Sagawa

Hiroshi Nagata

Masaru Nyui

Yoshitsugu Sohara

When a convex lenscomes close to 0-th order transmitted light Twith rotation of an optical scale, the 0-th order transmitted light Tderived from a light beam L emitted from a light sourceand transmitted through a diffraction gratingaround is converged and incident on a reference position signal detection sensor. At that time, a large output is obtained from the reference position signal detection sensor. This signal constitutes a reference position signal. On the other hand, reflective diffracted light beams La, Lb having been reflected by the diffraction grating are detected by a diffraction light detection sensorafter interference, so that the speed and the angle etc. of the scaleare detected. In this way, the reference position signal and an incremental signal are detected at the same position on the optical scale.

Displacement-measuring optical scale and optical encoder using same

A rotor portion, which is supported rotatably with respect to a housing, rotates due to magnetic action with a magnet attached to the rotor portion by flowing electric current through an electromagnetic coil. Vibration of the rotor portion becomes large if centrifugal force is generated due to eccentricity or unbalance. Positional sensors detect the deviations. In order to eliminate the deviations, electric current flows through an electromagnetic coil, causing a force in a radial direction to act on the rotor portion. A bearing device capable of correcting minute shaft deviations is thus obtained.

Bearing device

In a medium fixing method of fixing one or a plurality of mediums on a shaft while the one or plurality of mediums each having a circular opening portion in a substantially center are stacked and the shaft is inserted into the opening portions, the mediums are fixed to the shaft while the mediums into which the shaft is inserted are guided with a fluid.

Medium fixing method and medium support apparatus

To make it possible to locate a physically abnormal portion such as low-resistance short-circuiting between signal wirings or an open fault in a CMOS logic circuit without any design information, in a fault portion locating method for a semiconductor integrated circuit device, a first information table showing a correspondence between a physical abnormality and a defined abnormal I change mode is prepared in advance, a second information table showing a relationship between a model of the physical abnormality and a change of a light emitting element for the I abnormal pattern in an operation test pattern by emission analysis is prepared in advance, and in fault analysis, the tables are compared with the abnormal I obtained from the actual integrated circuit and the change of the light emitting element, respectively, to locate a physically abnormal portion.

Fault portion locating method for semiconductor integrated circuit device

A recording apparatus has a recording unit for recording, in response to image information, an image on a sheet conveyed through a common convey path, a first sheet support disposed at an upper part of a main body of the recording apparatus to obliquely support stacked sheets, a first automatic supply unit for automatically supplying the sheet supported by the first sheet support, a second sheet support disposed at a lower part of the main body of the recording apparatus to support stacked sheets horizontally, a second automatic supply unit for automatically supplying the sheet supported by the second sheet support, a first sheet supply path for conveying the sheet supplied from the first automatic supply unit sloped downwardly toward the common convey path, a second sheet supply path for surface reversing the sheet supplied from the second automatic supply unit and conveying the sheet toward the common convey path, and a third sheet supply path disposed between the first and second sheet supply paths.

Recording apparatus

With regard to a method for fault or failure analysis of a fault or failure phenomenon caused by a leakage current, or a method for characterization of semiconductor devices, pre-treatment is conducted to check a leakage point of the semiconductor devices covered by a conductive film. The pre-treatment includes a step of forming a metal film having a lower etching rate than a conductive film over a part of the conductive film. The metal film is used as a mask for forming a nonetching area on the conductive film, when the conductive film is etched. The metal film is also used as an electrode pad to be applied a potential at the characterization of the semiconductor devices.

Metal electrode mask in a method of fault failure analysis and

An apparatus for measuring the displacement of an object includes: a diffraction grating arranged on the object, a light source for irradiating a coherence light beam onto the diffraction grating, a first detector for causing two light beams whose phases relatively shift upon linear motion of the object of diffracted light diffracted by the diffraction grating to interfere with each other to detect the interference light beam, and a second detector for causing two light beams whose phases relatively shift upon rotary motion of the object of diffracted light diffracted by the diffraction grating to interfere with each other to detect the interference light beam.

Apparatus for measuring displacement using first and second detecting

The present invention relates to a rotation information detecting method of detecting rotation information of a rotating object, comprising the step of mounting a rotating scale on a rotating shaft of the rotating object, said rotating scale having a first pattern for detecting rotation information formed thereon in advance, the detection step of detecting the rotation information of the rotating object by detecting the first pattern and the formation step of forming a second pattern for detecting rotation information on the rotating scale on the basis of the detected rotation information.

Rotation information detecting apparatus and method

A method for forming a coating on at least one part to be coated has the steps of agitating a mixture including (i) the at least one part to be coated, (ii) a material that forms an adhesive layer on the at least one part to be coated, (iii) impact media, and (iv) multiple compositions of powder material; and fusing at least one of the multiple compositions of powder material.

Growing community of inventors

Utsunomiya, Japan

Hiroshi Watanabe