Kioxia Corporation

Rion Company Ltd.

National Institute of Advanced Industrial Science and Technology

Takata Corporation

Hiroshi Tomita

Hidekazu Hayashi

Kaoru Kondo

Takuya Tabuchi

Eishi Shiobara

Haruhisa Kato

Yuichiro Hodatsu

Yusuke Matsuura

Ayako Nakamura

Kazuna Bando

Sota Kondo

For an easy calibration using calibration particles, provided is a measuring device to capture images of target objects. An image analyzer acquires multiple images obtained at a predetermined time interval, (a) specifies the mean-square displacement of a bright point of a calibration particle based on the displacement of the bright point of the calibration particle in the multiple images in a calibration mode, and (b) specifies the mean-square displacement of a bright point of the target particle based on the displacement of the bright point of the target particle in the multiple images in a measurement mode. A particle size analyzer (c) derives the particle size of the target particle from the mean-square displacement of the bright point of the target particle based on the mean-square displacement of the bright point of the calibration particle and the particle size of the calibration particle in an analysis mode.

Particle measuring device, calibration method, and measuring device

According to one embodiment, a particle measuring method is disclosed. The method includes irradiating a detection liquid with light. The detection liquid contains methyl salicylate. The method further includes converting scattered light from the detection liquid into an electric signal by using photoelectric conversion after irradiating the detection liquid with the light. The method further includes performing a particle measurement on the detection liquid by using the electric signal.

Particle measuring method and detection liquid

Growing community of inventors

Tokyo, Japan

Hiroshi Tomita