Ricoh Company, Ltd.

Mitsubishi Heavy Industries Limited

Adv Antest Corporation

Other

Mitsubishi Heavy Industries Machinery Systems, Ltd.

Kishiro Hikari Kagaku Co., Ltd.

Ntt Data Ccs Corporation

Shionogi & Company Limited

Hiroshi Takemoto

Yoshihiro Morii

Shigeru Fujita

Shinobu Kanatani

Mitsuyoshi Uematsu

Mitsuru Nakajima

Seiji Kobayashi

Tomoaki Kitagawa

Syunichi Imanari

Toshio Kobayashi

Jun Yoshida

Seiji Hoshino

Kohei Shimizu

Fumikata Andoh

Norihiko Sasaki

Jun Andoh

Yoshiharu Kuze

Kazuhiro Ueshiro

Chihiro Tanaka

Noboru Murayama

Akira Takahashi

Takeshi Sano

Jun Ando

Nobuaki Ono

Shigeo Kobayashi

Kei Sato

Masami Takayama

Seiichi Hara

Hayato Yoshida

Akio Yashiba

Tsutomu Sakatsu

Takeshi Shiota

Naoya Iwata

Tatsuya Tsuyuki

Seiichi Kawanami

Kouji Terasawa

Takahito Shimomukai

Eiichi Sekine

Tadayoshi Kimura

Yuki Tokita

Aritoshi Mio

Hiroto Shimojo

Norio Iwasawa

Yasuhiko Andou

Masatoshi Arima

Norio Sato

Seiji Usui

An ultrasonic testing device includes: a signal acquiring unit which receives a reflected echo signal relating to a reflected echo of ultrasonic waves from an object being inspected, a defect detecting unit which detects a defect of the object being inspected on the basis of the reflected echo signal, and a display unit which displays the detection result of the defect detecting unit. The defect detecting unit uses the maximum signal strength of the reflected echo signal exceeding a first threshold value to detect the defect. The first threshold value is a value with which the signal strength is less than the maximum signal strength of the reflected echo signal from the surface of the object, using as an evaluation range an interval between a position which is positioned a first distance from the surface of the object and a bottom surface of the object.

Ultrasonic testing device, method, program, and ultrasonic testing system

An ultrasonic flaw detection device comprises a flaw detection unit for transmitting and receiving ultrasound, a swinging mechanism for supporting the flaw detection unit to swing around a swinging axis, and a locking mechanism for switching between a swinging state and a locked state. The ultrasonic flaw detection device controls the locking mechanism and swinging mechanism such that when the flaw detection unit is moved along a direction tangential to a surface to be inspected from a position removed from a first end part of the surface to be inspected to a lock release position, the flaw detection unit is put in the locked state such that a direction tangential to a contact surface and the direction tangential to the surface to be inspected coincide, and the flaw detection unit is switched from the locked state to the swinging state after the flaw detection unit reaches the lock release position.

Ultrasonic flaw detection device and method for controlling same

A server of a crop growth stage determination system includes a processor. The processor inputs first images obtained by image capturing crops in a manner such that crop shapes are extractable. The Processor inputs growth stages each indicating a level of physiological growth of the crops for each of the first images. The processor constructs a learned model by performing deep learning to associate images of the crops and growth stages of the crops based on the input first images and the input growth stage. The processor inputs a second image obtained by image capturing crops a growth stage of which is unknown, in a manner such that crop-shapes are extractable. The processor determines the growth stage for the input second image based on the learned model. The processor outputs the determined growth stage.

Server of crop growth stage determination system, growth stage determination method, and storage medium storing program

Ultrasonic flaw detection uses a phased-array ultrasonic-flaw-detection probe. The flaw detection probe is placed such that the center of curvature of the flaw detection probe coincides with a reference center of curvature of a subject. The flaw detection probe is translated along a scan direction. The flaw detection probe emits an ultrasonic beam such that the position upon which the ultrasonic beam converges coincides with the center of curvature of the curve of the outline of the cross section of the subject at the scan position, receives the resulting reflected beam, and estimates the length of a flaw in the circumferential direction of the subject. In addition, the estimated length of the flaw is corrected using a correction coefficient corresponding to the distance between the center of curvature of the reference scan position and the center of curvature of the scan position in the thickness direction of the subject.

Ultrasonic flaw detection device, ultrasonic flaw detection method, and ultrasonic flaw detection program

An impact sensing laminatehas a first surfaceon which an impact force acts; a second surfacebrought in contact with a protection object OBJ; an impact absorption layerand a first pressure-sensitive layer. When a direction heading for the second surface from the first surface is defined as a first direction, the first pressure-sensitive layer is in the first direction from the impact absorption layer. The first pressure-sensitive layer is a layer of sensing a first impact force as the impact force to have been attenuated by the impact absorption layer.

Impact sensing laminate, impact sensing method and protection object inspecting method

A supersonic inspection jig has an insertion sectioninserted into a holeof an inspection target, and a flange sectionconnected with the insertion sectionand contacting the inspection target. The flange sectionhas a flange section first surfacewhich is a surface on the side contacting the inspection targetand a flange section second surfacewhich is a surface on the side contacting the probe. A position limiting sectionis provided on the flange section second surfaceto limit the position of the probeso that the probeis maintained in a position separate from a central axis C of the hole. Thus, the inspection around the hole becomes easily executable.

Supersonic inspection jig and supersonic inspection method

A probe provided with a transceiving surface longer in a length direction than in a width direction thereof, and an array of ultrasonic elements provided on the transceiving surface, the probe being for emitting ultrasonic waves to a surface to be inspected of an object to be inspected that faces the transceiving surface, while moving in the width direction, the ultrasonic elements being shaped so as to have the same length in the length direction and in the width direction, and the certain of ultrasonic elements being aligned in the length direction and in the width direction and emitting ultrasonic waves a large number of times throughout the length direction in predetermined emission units of one or more ultrasonic elements.

Probe, ultrasonic testing apparatus, and ultrasonic testing control method

A portable ultrasonic testing device which with respect to a plate material having a chamfered surface formed between an outer plate surface and an inner peripheral surface, irradiates the chamfered surface with ultrasonic waves while moving along the chambered surface to thereby detect flaws in the plate material is provided with: a device frame; a probe which irradiates the chambered surface with the ultrasonic waves, and receives reflected ultrasonic waves; a wedge to which the probe is fixed and which is able to come into contact with the chamfered surface; a slide mechanism which moves the wedge in a sliding direction with respect to the device frame; a spring member which is urged in a direction in which the wedge and the chamfered surface approach each other in the sliding direction; and a movable roller and a pair of fixed rollers which are provided in the device frame and each have a rolling contract surface that is in contact with the inner peripheral surface.

Portable ultrasonic testing device and ultrasonic testing method

An image-capturing device including: an imaging optical system which is configured to capture an optical image of a subject; an imaging optical system retaining member which retains the imaging optical system; an imaging element which is configured to convert the optical image into an electrical signal; a substrate which is arranged on a back side of the imaging optical system retaining member and retains the imaging element; and a plurality of substrate joint pieces each of which extends from the imaging optical system retaining member toward the substrate, wherein tip parts of the plurality of substrate joint pieces on a substrate side and the substrate are joined by an indirect bond structure using at least one joint intermediate member which is adhered to at least one of the tip parts of the plurality of substrate joint pieces and the substrate with an adhesive, and a fixation structure.

Image-capturing device and in-vehicle camera

A flaw detection image analyzer () takes in an inspection procedure command stored in a flaw detection condition database (), takes in a flaw detection image signal corresponding to a flaw detection image indicated by the taken inspection procedure command from a database () for flaw detection image signal, and displays the flaw detection image based on the flaw detection image signal on a display (), with a display range and a contrast indicated by the inspection procedure command in an arrangement pattern of image indicated by the inspection procedure command. Consequently, optimum images can be displayed sequentially with optimum arrangement pattern, optimum display range and contrast according to a flaw to be inspected when a flaw is detected by observing an ultrasonic flaw detection image.

Analyzer of ultrasonic flaw detection image

A disclosed image pickup apparatus includes a first member holding a lens, and a second member holding an image pickup element converting an image formed via the lens into an electric signal, the second member having an approximately rectangular shape and two approximately arc-shaped location cutout portions at respective diagonal corners of the approximately rectangular shape. In the image pickup apparatus, the first and the second members are bonded via an indirect bonding structure portion where the first and second members are bonded via a fixing member with an ultraviolet curable adhesive and a filler bonding structure portion where the first and second members are bonded by supplying a thermosetting adhesive therebetween.

Image pickup apparatus, on-vehicle image pickup apparatus, method and apparatus for manufacturing image pickup apparatus

An optical scanning device configured to irradiate an object with light generating from a light source via at least one mirror with a first end portion and second end portion which are attached to a housing and to scan the object with the irradiating light is provided, wherein the first end portion of the at least one mirror is movably supported by the housing and the second end portion of the at least one mirror is bonded to the housing.

Optical scanning device, image forming apparatus, mirror, housing, mirror attaching method, mirror arrangement adjusting device, and mirror arrangement adjusting method

A mirror includes a substrate, a reflection layer, and a protection layer. The substrate includes a surface having an attachment area and a reflection area. The reflection layer is formed on the reflection area. The protection layer is formed on the reflection area on which the reflection layer is formed and the attachment area. Material of the protection layer is homogeneous across the reflection area and the attachment area.

Mirror and optical scanning device

Growing community of inventors

Tokyo, Japan

Hiroshi Takemoto