Mitsubishi Electric Corporation

Mitsubishi Denki Kabushiki Kaisha

Tdk Corporation

Hiroshi Sasai

Takashi Yoshioka

Hiroshi Tanaka

Satoru Kotoh

Naohiko Fujino

Masashi Ohmori

Akira Nishimoto

Tadashi Fukuda

Yoshinori Miyamoto

Kimiyasu Furusawa

Mutsumi Kinoshita

Koichiro Nishiyori

Koji Sakata

Keita Mochizuki

Junji Hori

Koji Funaoka

Masahiko Sakamoto

Shozui Takeno

Kiyotaka Watanabe

Taizo Iwami

Takuya Hashiguchi

Yukinobu Karata

Mitsutaka Yasuda

Kazuhiko Umeda

Katsuhiro Gokita

Toshio Chamura

A phase calculation unit () calculates, as a first phase, a deflection angle of a first similarity vector having a first similarity and a second similarity calculated by a similarity calculation unit () as elements. The phase calculation unit () calculates, as a second phase, a deflection angle of a second similarity vector having a third similarity and a fourth similarity calculated by the similarity calculation unit () as elements. A period calculation unit () calculates a period of a pattern formed on a long body on the basis of the first phase and the second phase calculated by the phase calculation unit (). An abnormality detection unit () detects an abnormality in the long body on the basis of the period calculated by the period calculation unit ().

Detection device

A wire rope flaw detector includes a magnetizer having a pair of exciting magnets disposed on a back yoke such that polarities thereof are opposite to each other, and forming a main magnetic path in a predetermined segment in an axial direction of a wire rope; and a leakage magnetic flux detection section disposed in the predetermined segment in the axial direction, and detecting leakage magnetic flux generated from a damaged portion of the wire rope. Each of the exciting magnets are formed so as to have a cross-section of a shape that embraces the wire rope when each exciting magnet is cut along a plane perpendicular to the axial direction of the wire rope, and has magnetic orientation, on the cross-section of the exciting magnet, oriented from at least two directions toward the wire rope.

Wire rope flaw detector

In order to examine abnormality in shape of an outer circumference of a wire rope, the rope tester device includes a comb-shaped detection plate having a curved test edge portion extending along at least one portion of an outer circumference of a substantially circular sectional configuration of the wire rope and a testing recessed portion for receiving the wire rope in the vicinity of or in contact with the test edge portion, and a support device for rotatably supporting the detection plate in the vicinity of or in contact with the wire rope for permitting the rotation of the detection plate when the detection plate receives a force from an abnormal portion of the wire rope to relieve the force. A test string is disposed in an opening of the testing recessed portion for testing a surface that is not in the vicinity of or in contact with the test edge portion.

Rope tester detection plate

A magnetic flux generated by current excitation is allowed to pass through a part or an entire of a magnetic path of a leakage magnetic flux. A magnetic flux content due to the current excitation is temporally changed to change a leakage magnetic flux content interlinked with a detection coil so that an induced voltage is generated in the detection coil. Consequently, damage can be detected even in a case where there is no relative speed between a wire rope and a wire rope flaw detector. Further, a configuration of the magnetic path and the number of ampere turns of an exciting coil are set to be appropriate to prevent the magnetic flux generated by the current excitation from passing through the detection coil or to allow the magnetic fluxes offset each other. Thus, noise superimposition on the detection coil due to the current excitation can be prevented.

Wire rope flaw detector for increasing accuracy independent of speed while conserving detector size

A wire rope flaw detector comprises a back yoke and excitation permanent magnets, which form a main magnetic path in a predetermined section of a wire rope in the axial direction; a magnetic path member arranged in the predetermined section to be magnetically insulated from the back yoke and the permanent magnets and making the leakage flux generated from a damaged part of wire rope detour to the outside of the wire rope; and a detection coil wound around the magnetic path member for detecting leakage flux. The amount of leakage flux can be increased by providing the magnetic path member and since the windable area of the detection coil is increased, the number of turns of detection coil can be increased.

There is obtained a wire-rope flaw detector capable of realizing a high signal-to-noise ratio even in the case where only one detection coil is disposed. In the wire-rope flaw detector, there are provided a magnetizer that forms main magnetic flux in a predetermined section located along an axis direction of a wire rope () and a detection coil () that detects, in the predetermined section, leakage magnetic flux () emitted from a flaw portion () of the wire rope (); a magnetic circuit member () made of a ferromagnetic material intervenes in a magnetic circuit for leakage magnetic flux that is interlinked with a detection coil (); and in a space where at least one of the end portions, of the magnetic circuit member (), that serve as the inflow port and the outflow port for the leakage magnetic flux is inserted between the detection coil () and a wire rope (), an opening portion extends in such a way as to intervene between the foregoing end portion and the other end portion and is inserted between the detection coil () and the wire rope ().

Wire-rope flaw detector

A first terminal block having first terminals to be in contact with terminals of a plug is incorporated in a housing. The first terminals are exposed to an internal space portionof the housing, while the rear ends of the first terminals project at the rear of the block. A second terminal block has second terminals to be connected to a motherboard the modular jack should be attached to. Electronic parts a are mounted on an internal board. The internal board includes through-hole-like terminals or notch-like terminals to which the first and second terminals and should be soldered. Winding terminals of winding parts are inserted and soldered to through holes of the internal board.

Modular jack

A laser inspection apparatus has a light source for outputting laser beam, application means for irradiating the laser beam output from the light source to any desired position of a detected body , first detection means for detecting fluorescence generated from the detected body to which the laser beam is applied, and second detection means for detecting reflected light scattered on a surface of the detected body to which the laser beam is applied.

Laser inspection apparatus

A combined-type coil device provided with a core, a first coil and a second coil, where the core is provided with at least four through holes and the through holes are roughly parallel to one another. When a combination of two through holes constitutes a first through holes pair and the combination of the remaining two through holes constitutes a second through holes pair, a center line passing through the centers of the holes in the first through hole pair and a center line passing through the centers of the holes in the second through hole pair extend almost perpendicular to each other. The first coil passes through the first through hole pair, whereas the second coil passes through the second through hole pair.

Coil device

A semiconductor cleaning apparatus includes a cassette loader/unloader for moving a cassette; a product loader/unloader for loading a wafer into and unloading a wafer from a cassette; a cleaner for cleaning a wafer; a water cleaner for cleaning with water a wafer that has been cleaned in the cleaner; a dryer for drying the wafer that has been cleaned with water in the water cleaner; and a conveyance having a wafer grasping hand for directly holding a wafer unloaded from a cassette and sequentially conveying the wafer held by the wafer hand to the cleaner, the water cleaner, and the dryer.

Semiconductor cleaning apparatus and wafer cassette

A semiconductor cleaning apparatus having: a loader/unloader portion for injecting/ejecting a product cassette which accommodates a wafer; a product injecting/ejecting portion for injecting/ejecting the wafer from the product cassette; a cleaning portion for cleaning the wafer; a water cleaning portion for, with water, cleaning the wafer which has been cleaned in the cleaning portion; a drying portion for drying the wafer which has been cleaned with water in the water cleaning portion; and a conveyance portion having a wafer hand for directly holding the wafer ejected from the product cassette in the product injecting/ejecting portion and sequentially conveying the wafer held by the wafer hand to the cleaning portion, the water cleaning portion and the drying portion.

Growing community of inventors

Tokyo, Japan

Hiroshi Sasai