Opt Gate Co., Ltd.

National University Corporation Nagaoka University of Technology

Hiroshi Ono

Moritsugu Sakamoto

Kohei Noda

Provided is an optical measurement apparatus including: a polarized light irradiation unitthat irradiates a subject Ob with irradiation light of which polarization is controlled; and a polarization imaging unitthat images a polarization state of measurement light occurring due to scattering or the like of the irradiation light by the subject Ob, calculates Stokes parameters of the measurement light, and measures a variation of a polarized component occurring between the irradiation light and the measurement light. Since the subject is irradiated with irradiation light of which a polarization state is controlled, it is possible to acquire subject information that is difficult to measure in a case of irradiating the subject with natural light, and it is also possible to suppress noise or the like that occurs when measuring polarization by irradiating the subject with irradiation light of which a polarization state is unstable.

Growing community of inventors

Niigata, Japan

Hiroshi Ono