Kabushiki Kaisha Toshiba

Hitachi, Ltd.

Sony Corporation

Toshiba Materials Co., Ltd.

Nec Corporation

Riken Corporation

Toshiba Kikai Kabushiki Kaisha

Toshiba Digital Solutions Corporation

Microsoft Technology Licensing, LLC

Tokyo Electron Limited

Toshiba Tec Kabushiki Kaisha

Osaka University

Xanavi Informatics Corporation

Seoul Semiconductor Co., Ltd.

National Institute for Materials Science

Hiroshi Ohno

Hideaki Okano

Mitsuo Sasaki

Yuji Sasaki

Hideo Tabuchi

Masataka Shiratsuchi

Masayuki Tanaka

Takashi Usui

Akinobu Shimada

Yoshinori Honguh

Yoshiaki Eguchi

Yasutomo Yamamoto

Ai Satoyama

Toshio Nakano

Katsumi Hisano

Kouji Arai

Toshiaki Arai

Tomoki Sekiguchi

Takeshi Morino

Makoto Ando

Takayuki Kobayashi

Kazushige Yamamoto

Hiroshi Yamazaki

Soichiro Shibasaki

Kozo Nakamura

Yoshinori Endo

Naotada Okada

Koji Atarashi

Takeshi Tanoue

Kiichiro Urabe

Kazuo Watabe

Shinya Sakurada

Mutsuki Yamazaki

Yasuhiro Shirakawa

Masahiko Saito

Hideo Tamura

Kiyotaka Miyano

Takahito Kabai

Mariko Okude

Kei Kaneko

Kenya Honda

Tomonori Aoyama

Junya Tanaka

Masahiko Yamamoto

Jun Hirose

Toshihiko Iinuma

Rei Hashimoto

Hiroya Kano

Mitsuaki Kato

Takahiro Kamikawa

Satoshi Tsuno

Takashi Obara

Kazuyuki Masukawa

Masamichi Okada

Shanying Pan

Tomonao Takamatsu

Takahiro Terada

Hiromichi Hayashihara

Shigenori Kaneko

Yuichiro Yamamoto

Tomoaki Nakamura

Taro Inoue

Yasutomo Shiomi

Tatsuya Sakata

Naoto Shimizu

Masataka Innan

Hiroyasu Kondo

Osamu Fujii

Nobuyuki Hara

Tadashi Kamiwaki

Toru Hanada

Takashi Shibata

Ryoji Tsuda

Tetsuo Sakai

Masakazu Nagasawa

Kiminori Toya

Bernat Olle

Junichiro Ooga

Tomoyuki Suzuki

Yasumasa Ooya

Naoyuki Nakagawa

Junji Oaki

Nobukatsu Sugiyama

Toshiaki Yamauchi

Hisanobu Ajima

Michihiko Inaba

Masatoshi Hirono

Hiroshi Koizumi

Cory J Cirrincione

Tsutomu Kakuno

Hiroki Hiraga

Tetsuo Sato

Yoshiyuki Ishihara

Yoshitaka Atarashi

Yongfang Li

Hiroki Oka

Takaharu Itani

Yusuke Suzuki

Itaru Chida

According to one embodiment, an optical machining apparatus includes a first light source, and a second light source. The first light source is configured to radiate a first beam onto a first position of a surface of a work in such a manner as to transfer heat at a temperature lower than a melting temperature of the work from the first position of the work to a second position of a surface of the work on an opposite side to the first position. The second light source is configured to radiate a second beam onto the second position such that a temperature of the work exceeds the melting temperature of the work, in a state in which a temperature of the second position is raised by the transfer of the heat.

Optical machining apparatus

Provided is a stent comprising: a stent skeleton; and a deposition layer containing a plurality of layers deposited on the stent skeleton; each layer of the deposition layer comprising crystalline cilostazol, at least one of the plurality of layers comprising a bioabsorbable polymer.

Drug-eluting stent including crystalline cilostazol

According to the embodiment, an optical inspection method includes: acquiring an image by capturing the image, using light from a surface of an object, which passes through a wavelength selection portion configured to selectively pass light components of a plurality of predetermined wavelengths different from each other, the image sensor including color channels configured to discriminately receive the light components of the plurality of predetermined wavelengths, performing color count estimation processing configured to estimate the number of colors based on the intensity ratio of the color channels that have received the light in each pixel of the image, and performing scattered light distribution identification processing configured to identify a scattered light distribution as BRDF from the surface of the object based on the number of colors or surface state identification processing configured to identify a state of the surface of the object based on the number of colors.

Optical inspection method, non-transitory storage medium storing optical inspection program, processing device, and optical inspection apparatus

According to one embodiment, an optical inspection method includes projecting first pattern light in a first basic modulation mode that periodically changes in bright and dark, onto an object, acquiring a first image by capturing an image of the object onto which the first pattern light has been projected, projecting second pattern light in a first inverted modulation mode in which bright and dark are inverted with respect to the first basic modulation mode, onto the object, acquiring a second image by capturing an image of the object onto which the second pattern light has been projected, and generating a singular light-scattered image in which a singular region including uniquely-scattered light that is extracted based at least on the first image and the second image is intensified.

Optical inspection method and storage medium, and optical inspection apparatus that uses the same

According to an embodiment, an optical inspection method includes calculating irradiation field information concerning an irradiation field on a surface of a subject when irradiating the surface of the subject with a light beam from an illumination device that is supported by a movable body and moved; and performing path calculation processing of calculating, based on the irradiation field information, a path for the illumination device to move.

According to the embodiment, a processing apparatus includes an arithmetic section. The arithmetic section is configured to calculate a refractive index distribution forming a light beam path based on an estimated output calculated by inputting light beam data indicating the light beam path to an estimation model, an updated output calculated based on the light beam data and the estimated output, and an evaluation index of the estimation model calculated from a ray equation independent of a time which the light beam path follows.

Processing apparatus and method for calculating refractive index distribution based on light beam data, optical apparatus including the processing apparatus, manufacturing apparatus for creating optical element

According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.

Optical test apparatus and optical test method

According to an embodiment, an optical inspection apparatus includes an imaging portion, a first wavelength selection portion, an illumination portion, and a second wavelength selection portion. The imaging portion includes an image sensor configured to capture a subject by light from the subject. The first wavelength selection portion is provided on an optical axis of the imaging portion and is configured to selectively pass a plurality of light components of predetermined wavelengths. The illumination portion is configured to illuminate the subject. The second wavelength selection portion is provided on an optical axis of the illumination portion and is configured to pass the plurality of light components of the predetermined wavelengths complementarily to the first wavelength selection portion.

Optical inspection apparatus, processing device, optical inspection method, and non-transitory storage medium storing optical inspection program

According to the embodiment, an optical inspection method for a surface state of a subject includes acquiring and discriminating. The acquiring includes acquiring a color vector of a color corresponding to a wavelength spectrum in a color coordinate system of n dimensions (n is a natural number equal to or larger than 1), which is equal to or smaller than a number of a plurality of color channels of pixels of an image sensor, with optical imaging using a wavelength spectrum selection portion that selectively allows a plurality of wavelength spectra different from one another from a surface of the subject to pass. The discriminating includes discriminating the surface state of the subject based on a direction of the color vector in the color coordinate system.

According to one embodiment, a processing device includes an acquisition part, and a processor. The acquisition part and the processor are configured to perform a first operation. The acquisition part is configured to acquire first image data, second image data, and third image data in the first operation. The first image data includes data related to a first object member image of an object member transmitting a first light. The second image data includes data related to a second object member image of the object member transmitting a second light. The third image data includes data related to a third object member image of the object member transmitting a third light. The processor is configured to derive first derived data based on the first, second, and third image data in the first operation.

Processing device, measurement device, and measurement method

In an embodiment, a processing device relating to an inspection of an inspection object by a photography unit is provided. A processor of the processing device calculates a plurality of photography points as positions photographing the inspection object based on shape data in which a shape of a surface of the inspection object is indicated by a point group, and information relating to a position and a normal vector on the surface of the inspection object is defined by the point group. The processor executes analysis regarding a path that passes through all of the calculated photography points and minimizes a sum of a movement cost from each of the photography points to a photography point of a next movement destination, and calculates a path corresponding to an analysis result as a path for moving the photography unit.

Processing device relating to inspection of inspection object, inspection system of inspection object, processing method relating to inspection of inspection object, and non-transitory storage medium

According to an embodiment, an optical apparatus includes an illumination unit, a light-receiving unit and a processing unit. The illumination unit can illuminate an object with a plurality of pattern rays including rays with different wavelengths simultaneously. The light-receiving unit includes a pixel that can receive the rays from the object to disperse at least two of the different wavelengths included in the pattern rays. The processing unit acquires information on the object based on a result of the pixel of the light-receiving unit receiving the pattern rays with which the illumination unit illuminates the object simultaneously.

Optical apparatus, optical inspection method and non-transitory storage medium

An optical inspection deviceA includes a light selection unit, a detection element, and a first image formation element. The light selection unithas the plurality of wavelength selection regionsthat selectively transmits or reflects the light rays L of mutually different wavelength regions. The detection elementdetects scattering characteristic information of the light rays L having reached the light receiving surfacevia the light selection unit. The first image formation elementcauses scattered light scattered by a subject S to enter a light receiving surfacevia the light selection unit. The plurality of wavelength selection regionshas different azimuth angles with respect to the optical axis z of the first image formation element

Optical inspection device

According to one embodiment, an optical imaging apparatus includes a polarizer assembly, a polarization image sensor, and a lens assembly. The polarizer assembly is configured to acquire a first light ray of a first polarization component and a second light ray of a second polarization component which is different from the first polarization component, by using a light flux from an identical direction. The polarization image sensor is located in a position facing the polarizer assembly. The polarization image sensor is configured to acquire an image of the first polarization component and an image of the second polarization component at once or at the same time. The lens assembly includes a first lens configured to form the images on the polarization image sensor.

Optical imaging apparatus, robot hand, moving body, and LiDAR apparatus

According to one embodiment, an optical inspection method acquires, for an image point imaged through separating light from an object point into beams of light in at least two different and independent wavelength ranges, a hue vector having, as independent axes, intensities of the beams of light in the at least two different and independent wavelength ranges. The method then acquires, from the hue vector, information regarding a ray direction of the light from the object point.

Optical inspection method, optical inspection device, and non-transitory computer-readable storage medium storing optical inspection program

Growing community of inventors

Yokohama, Japan

Hiroshi Ohno