Seiko Instruments Inc

Other

Sii Nanotechnology Inc.

Seiko Instruments & Electronics Ltd.

Fuji Yakuhin Co., Ltd

J-Oil Mills, Inc.

The Head of Agency of Industrial Science and Technology

Hiroshi Muramatsu

Norio Chiba

Katsunori Honma

Tatsuaki Ataka

Masamichi Fujihira

Noritaka Yamamoto

Kunio Nakajima

Isao Karube

Akira Egawa

Nobuhiro Shimizu

Masayuki Suda

Sachiko Tanabe

Hiroshi Ito

Yuji Yamamoto

Takashi Yamaguchi

Masataka Shinogi

Masatsugu Shigeno

Naoya Watanabe

Yoshiharu Shirakawabe

Takashi Hiraga

Yusuke Hara

Takahiko Nakamura

Masato Iyoki

Akira Inoue

Eisuke Tomita

Minao Yamamoto

Takeshi Umemoto

Tetsuo Moriya

Rie Igarashi

Osamu Matsuzawa

Yasuo Kosaka

Amiko Nihei

Mitsuko Takenaga

Tetsuo Ebata

Tadayoshi Sadakane

Katsunori Homma

Masaya Fujimoto

Noritake Yamamoto

Akihiro Mito

Xuanjing Ye

A piezoelectric unitincludes a piezoelectric element that causes thickness shear vibration, a first electrode provided on one surface of the piezoelectric element, a second electrode and a third electrode which are provided on an opposite surface to the one surface which is provided with the first electrode of the piezoelectric element and are electrically insulated from each other, and a switching portion that is connected to the first electrode, the second electrode, and the third electrode, in which the switching portion can switch measurement modes between a mass/viscoelasticity measurement mode for measuring mass of a substance which is in contact with the piezoelectric element or viscoelasticity by vibrating the piezoelectric element, and an electrical characteristic measurement mode for measuring electrical characteristics between the second electrode and the third electrode.

Piezoelectric unit, piezoelectric device, piezoelectric determination apparatus, and state determination method

A QCM sensor for detecting a physical quantity of a sample includes a quartz crystal vibrator for measurement, a quartz crystal vibrator for reference, and a housing accommodating the quartz crystal vibrator for measurement and the quartz crystal vibrator for reference. The quartz crystal vibrator for measurement has a first electrode that is contacted by a measurement sample to be detected, and a first quartz substrate provided with a surface on which the first electrode is formed. The quartz crystal vibrator for reference has a second electrode that is contacted by a reference sample as a reference when detecting a physical quantity of the measurement sample, and a second quartz substrate provided with a surface on which the second electrode is formed. A confining portion connects to the housing to confine the reference sample in a state of contacting the second electrode.

QCM sensor

An oil and fat composition is provided having superior operability and processability, in terms of a liquefying phenomenon of sugar, tackiness and texture of fried doughnuts, filling condition and hardness of shortening, and solidifying time of coating chocolate, by the superior crystallization-promoting effect. A palm-based fractionated oil and fat has 70-90% by weight of the tripalmitin content to triglyceride and 1-8% by weight of the unsaturated fatty acid content to total fatty acid. The oil and fat comprises a hard part obtained by, for example, performing a crystallization operation of palm super stearin with iodine value 10-17 so that the slurry SFC is 20% or less, and fractionating the slurry so that the hard part yield is 26% by weight or less. The fractionation is preferably performed so that a numerical value of the hard part yield/the slurry SFC is 10 or less.

Palm-based fractionated oil and fat, oil and fat composition and food product containing the same

A cantilever includes: a lever portion; a holder portion supporting the proximal end of the lever portion; a probe portion arranged at the distal end of the lever portion and having a spherical surface to face a sample; and a retaining portion fixed to the distal end of the lever portion and retaining the probe portion to surround a periphery of the probe portion. There is provided a cantilever allowing mounting of a probe portion with little effect in a short time without using any adhesive.

Cantilever and cantilever manufacturing method

A manufacturing method for a light propagating probe comprises a step of sharpening a light-propagating body having a sharpened section formed on an optical fiber, a step of forming the light-propagating body into a hook shape close to the sharpened section, a metal film coating step for forming a transparent opening section in a tip section, a step of protecting the transparent opening section with a resist material, a step of forming a reflecting surface for a light lever method, a step for metal film coating a spring operating part to the rear from the hook-shaped section, and a step of removing the resist material protecting the transparent opening section.

Method of manufacturing light-propagating probe for near-field microscope

A blood rheology measuring apparatus has a measuring portion for measuring blood circulation information inside of a living body from outside of the living body. The blood circulation information is a maximum blood flow velocity for one pulse. An information processing portion processes the measured information from the measuring portion to obtain information concerning a blood rheology of the living body.

Blood rheology measuring apparatus

A light probe microscope has a probe having a tip, a mechanism for positioning the probe tip closely to a sample surface and causing two-dimensional scanning movement between the probe tip and the sample, a light source for emitting light to an area proximate the probe tip and the sample, a two-dimensional image sensor for receiving the light radiated from the sample and producing a two-dimensional image of the sample in accordance therewith, and a device for producing a light image based on a signal intensity of light in a detection region of the two-dimensional image.

Light probe microscope including picture signal processing means

A sample observation plate is provided which is smooth in a surface in molecular levels and cheap in price, thereby making feasible topological and optical observation in molecular levels. In a sample observation plate to be used on an apparatus for observation of topological and optical information in molecular levels, the sample observation plate is structured by bonding a crystalline thin film on a glass plate. Furthermore, using this sample observation plate, an observation apparatus is structured.

Sample observation plate and observation apparatus

Silicone sheet and surgical bandage manufactured using the same

A proximity field optical microscope is provided which can simultaneously conduct optical observation in the ultraviolet and infrared light ranges and conduct geometrical observation and detect other physical information, wherein a microscopic opening is stably and easily formed in a probe tip with low manufacturing cost and high yield. The microscope has an optical probe which comprises a tube having a tip portion formed with a smaller diameter than an overall diameter of the tube, an optically opaque material coated on the tube, an optical microscope opening formed at the tip portion, and an optical waveguide having at least two optical end surfaces, one end surface being inserted in the tube facing the microscopic opening.

Optical probe and method for manufacturing same and scanning proximity field optical microscope

A self-emitting optical probe having a built-in light-emitting function, wherein the light-emitting mechanism and the aperture portion of the optical probe are formed by depositing an electrically conductive thin film, an organic thin film, and a metallic film by means of sputtering and oblique vacuum evaporation while rotating the core. The self-emitting optical probe enables an inexpensive scanning near field optical microscope yet simplified in operation.

Self-emitting optical probe, method for producing the same, and scanning near-field optical microscope

A probe for a near-field optical microscope was conceived in which a tube is thermally bent in the form of a hook; a microscopic aperture of the tube which has been thermally extended and cut away is provided at an end thereof; a part of the tube opposite to the microscopic aperture is removed to form an aperture at the removed portion to thereby provide a structure having no obstacle in the space between said aperture at the end and a near-field optical microscope utilizing the same was configured.

Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope

A method of fabricating a probe comprises disposing a resist film over a base plate. A mask pattern comprised of a cantilever mask pattern and a probe mask pattern is disposed over the base plate for forming a cantilever portion and a probe portion, respectively, of a probe so that the probe mask pattern subtends an angle relative to the base plate that is no greater than an angle made by at least two crystal planes of a tip of the probe portion to the base plate. The mask pattern is then exposed, and an etching operation is conducted using the exposed mask pattern to form the probe having the cantilever portion and the probe portion.

Method of fabricating probe force atomic force microscope

In a method for sharpening a probe, a probe preform having a longitudinal axis is at least partially immersed in a mixture containing at least an etch solution and a non-etch solution having a lower specific gravity than and which is not miscible with the etch solution. The probe preform is moved in the mixture along the longitudinal axis thereof during etching at a speed which does not exceed a taper length forming speed for a probe preform which is not moved in the etch solution during etching. An end of the probe preform is etched into a sharp tapered tip having a taper angle greater than that obtained for the probe preform which is not moved during etching.

Method for sharpening a probe

A scanning probe microscope comprises a cantilever probe disposable proximate a surface of a sample and having a first resonance frequency. A three-dimensional fine movement element scans the cantilever probe and the surface of the sample relative to one another two-dimensionally. A sensor cantilever detects displacement of the cantilever probe during relative scanning movement between the cantilever probe and the surface of the sample. The sensor cantilever has a second resonance frequency different from the first resonance frequency and is disposed spaced apart but within touching distance from the cantilever probe so that displacement of the cantilever probe is transmitted to the sensor cantilever by contact between the sensor cantilever and the cantilever probe.1

Scanning probe microscope

Growing community of inventors

Chiba, Japan

Hiroshi Muramatsu