Sharp Kabushiki Kaisha Corporation

Kabushiki Kaisha Toshiba

Toshiba Electronic Devices & Storage Corporation

Panasonic Corporation

Panasonic Intellectual Property Management Co., Ltd.

Eagle Industry Co., Ltd.

Nec Corporation

Nihon Kohden Corporation

Mitsubishi Denki Kabushiki Kaisha

Ntt Docomo, Inc.

Dai Nippon Printing Co., Ltd.

Toshiba Memory Corporation

Nippon Steel Sumitomo Metal Corporation

Toshiba Lighting & Technology Corporation

Nippon Steel Corporation

Hiroshi Kubota

Nobu Matsumoto

Hiroki Takeoka

Koichi Mihara

Yukihiro Shimasaki

Hiroshi Fujii

Yukikazu Ohchi

Yuichiro Tokunaga

Hideyuki Inoue

Yasuyuki Ishiguro

Masatoshi Itadani

Takeshi Hosoe

Akira Yoshino

Yuta Negishi

Kazuya Koyama

Keiichi Chiba

Hisashi Yoshimura

Toshihide Ohgoshi

Kazumasa Sunagawa

Naoki Kobayashi

Jun Yamaguchi

Masaharu Kimura

Norihiro Ochi

Hiroshi Kawahito

Hajime Horinaka

Toshiyuki Hiraoka

Takao Abe

Shoji Tanaka

Kazuhiko Takaishi

Masanori Furuta

Masanobu Deguchi

Rempei Nakata

Hisashi Kunihiro

Kenji Fujiwara

Takahiko Kimura

Takeshi Saito

Masatoshi Kaneshige

Mitsuru Tokuyama

Yoshiaki Akazawa

Hideshi Izumi

Sunao Takeda

Masahiko Kamata

Hiroo Naoi

Masafumi Iwashiro

Takuro Hiramatsu

Itsuko Sakai

Yusuke Hagiwara

Kentaro Yoshioka

Hiroki Nakagawa

Hisao Yamauchi

Yuhsuke Yoshimoto

Katsunobu Hamamoto

Kenji Kiryu

Tomonori Fukushima

Hideaki Kurimoto

Kohji Tsurui

Takahiro Horiuchi

Tadashi Tokai

Yoshioki Ozeki

Naruhiko Kaji

Yasuharu Morinishi

Yoshio Kanayama

Hiroshi Terasaka

Yuya Matsubara

Naoko Iwai

Takashi Yoda

Hiroyuki Sako

Ryoma Yamakawa

Fuxiang Hu

Yasuhiro Hiraki

Kouichi Irihara

Kouichi Takenouchi

Masahito Sano

Mineharu Uchiyama

Ryosuke Mano

Yasunori Hayashida

Hisao Kawasato

Kazuyuki Isawa

Akiko Tsuji

Kazuhiro Nakatsubo

Yukihiko Sugimoto

Hidekazu Matsuoka

Saki Sato

Katsuhiko Kyuken

Ryuichi Nakashima

Ryosuke Kamiura

Hiroshi Ootani

Ryo Majima

Ryo Usami

Masahiro Sugiyama

Shintarou Fujioka

Masahiko Hoshino

Chiaki Tomatsu

Tetsuro Ino

Yusuke Yoshimoto

Yasuo Yoshioka

Yoshitaka Yamanaka

Tomoaki Katagiri

Kenya Yamashita

Masahiro Imanari

A light detector according to one embodiment includes pixels, selection circuits, and an output circuit. The pixels each includes an avalanche photodiode. The selection circuits are respectively coupled to the pixels. The selection circuits are configured to output a signal output from a pixel selected from the pixels to a first node. The output circuit is coupled to the first node. The output circuit is configured to apply a first operating voltage to the avalanche photodiode included in the selected pixel via a selection circuit of the selection circuits that is coupled to the selected pixel, output an current based on the signal output from the selected pixel to a second node, and change the first operating voltage.

Light detector and distance measuring device

A photodetector includes a plurality of cells each configured to detect light and including: a light receiving element configured to output an electrical signal upon receipt of the light, a resistor connected to the light receiving element, and first and second switches connected to the resister. Either the first switch or the second switch is turned on according to a selection signal. The photodetector further includes a first output terminal connected to the first switch of each of the cells and through which a first output signal is output based on the electrical signal that has been output from the first switch, and a second output terminal connected to the second switch of each of the cells and through which a second output signal is output based on the electrical signal that has been output from the second switch.

Photodetector

According to an embodiment, a distance measuring device measures a distance to the measured object base on light scattered on the measured object is detected. The distance measuring device includes an optical detector and a measurer. The optical detector detects the scattered light. The measurer has a sampler to sample a signal corresponding to an output signal of the optical detector every time when the light is emitted at a plurality of sampling time points and a storage to accumulate sampling values and store an accumulation value at each sampling time point. The measurer measures the distance based on a plurality of accumulation values at the sampling time points.

Distance measuring device

A light detector according to an embodiment includes a light receiver and a controller. The light receiver includes sensors and pixels. The sensors are arranged two-dimensionally on a substrate. The controller is configured to set a light-receiving region in which the sensors are selectively turned on in the light receiver. The controller sets first and second light-receiving regions. The first and second light-receiving regions include first and second pixel, respectively. The second light-receiving region is arranged away from an optical axis of laser light received by the light receiver. The controller, after turning on each of the first pixel and the second pixel, is further configured to turn off the second pixel in a state in which the first pixel is turned on.

A photodetector includes a plurality of channels each having a plurality of SPAD units, each SPAD unit having an avalanche photodiode. The photodetector is capable of selecting outputting or non-outputting of the channels. The SPAD unit includes: an active quenching circuit which performs active quenching of the avalanche photodiode; and a control circuit which brings the active quenching circuit which corresponds to the channel where non-outputting is selected into an operable state.

Photodetector and distance measuring device

A distance measuring device according to one embodiment includes a light emitter, a first light receiver, and a second light receiver. The light emitter includes a light source. The light source emits an optical signal. The first light receiver includes a first sensor and a first optical system. The first sensor includes first pixels. The first optical system is configured to guide a reflected light of the optical signal emitted from the light emitter to the first sensor. The second light receiver includes a second sensor and a second optical system. The second sensor includes second pixels. The second optical system is configured to guide the reflected light to the second sensor.

A light detector according to an embodiment includes a light receiver and a controller. The controller is configured to set first and second light-receiving regions. The first light-receiving region includes first and second pixel regions. The second light-receiving region includes a third pixel region. An area of the third pixel region is larger than a total area of the first and second pixel regions. The light receiver is configured to, when light is applied: cause each of the first and second pixel regions within the first light-receiving region to individually output a signal; and cause the third pixel region within the second light-receiving region to output signals collectively.

A sensor includes an avalanche photodiode (APD), a first resistor, a second resistor, and a rectification element. The first resistor is connected between a current output terminal of the APD and a first output terminal. The second resistor and the rectification element are connected in series between the current output terminal and a second output terminal. The rectification element is connected between the second resistor and the second output terminal.

Sensor and distance measuring device

A method for determining photodetector elements used for measurement, from photodetector elements of a photodetector device, includes directing measurement light to an object, such that the measurement light reflected by the object is incident on the photodetector device, selecting a group of candidate photodetector elements that are consecutively arranged to each other from the plurality of photodetector elements, and obtaining an output signal from each of the candidate photodetector elements of the group when the reflected measurement light is incident on the photodetector device. The method further comprises repeatedly shifting the group of candidate photodetector elements to select a new group of candidate photodetector elements that are consecutively arranged, obtaining the output signal from each of the candidate photodetector elements of each newly-selected group, and determining the photodetector elements used for measurement, based on the output signals from the candidate photodetector elements of each selected group.

Determination of photodetector elements used for measurement

The infrared denaturing device of the present invention is provided with: an infrared lamp which emits infrared light; a light guide which guides the infrared light; and a light projecting body which radiates the infrared light guided from the light guide onto an object to be denatured. The light projecting body is provided with: a reflecting surface which reflects the infrared light; and a radiating surface which radiates the infrared light reflected by the reflecting surface onto an object to be irradiated. Further, there is also provided a denaturing detection sensor which detects denaturing, by means of the infrared light, of a region being denatured.

Infrared denaturing device

A liquid crystal light control apparatus includes a liquid crystal light control film and power supply device that drives liquid crystal light control film. Liquid crystal light control film has a structure wherein liquid crystal layer is sandwiched between paired transparent electrode layers, and used by being adhered to a large transparent member. Power supply device supplies a predetermined AC voltage between terminals a and b of liquid crystal light control film. A condition |Z|&#x2264;&#x3b1;&#xd7;RF is set where RF is a DC resistance between terminals a and b of liquid crystal light control film, |Z| is an output impedance between terminals A and B of power supply device, and predetermined coefficient &#x3b1;=0.2. In order to protect power supply device, condition Vp/Imax&#x2264;|Z|&#x2264;&#x3b1;&#xd7;RF is set where Vp is output peak voltage of power supply device and Imax is maximum allowable current.

Liquid crystal light control apparatus and method for manufacturing same

In one embodiment, a method of manufacturing a semiconductor device includes forming a stacked film on a substrate. The method further includes forming, on the stacked film, a mask layer formed of a tungsten compound and including impurity atoms having a concentration of 1.0&#xd7;10atoms/cmor more. The method further includes etching the stacked film using the mask layer as an etching mask.

Method of manufacturing semiconductor device

According to an embodiment, a distance measuring device includes emission circuitry, an optical mechanism system, and measurement circuitry. The emission circuitry emits pulse light having a predetermined pulse width. The optical mechanism system emits the pulse light emitted by the emission circuitry to an object to be measured and receives scattered light of the pulse light scattered by the object to be measured. The measurement circuitry measures, via the optical mechanism system, a distance to the object to be measured using a detection signal having magnitude corresponding to light intensity received within a time range corresponding to the pulse width.

In an embodiment, in a sliding component, a sliding face of a stationary-side seal ringhas a fluid circulation groovecommunicating with a high-pressure fluid side via an entrance portionand an exit portion. A rotating-side seal ringhas a larger outer diameter and a smaller inner diameter than the seal ring. A grooveinto which a claw is loosely fitted is provided on an outer periphery of the seal ring. A width of the grooveis smaller than a distance between the portionand thein the circumferential direction. WMR/WSR is set within a range of 0.75&#x3c;WMR/WSR&#x3c;1.4 (WMR is a face width between an inner diameter of the grooveand an inner diameterof the sliding face; WSR is a face width of the sliding face).

Sliding component

In an embodiment, a slide component includes one slide partprovided, on a low-pressure side of a sealing face thereof, with a negative pressure generation mechanismincluding a negative pressure generation groove. The negative pressure generation groovecommunicates with a high-pressure fluid side and is separated from a low-pressure fluid side by a land portion R. Another slide partis provided, in a sealing face thereof, with at least one interference groovecommunicating with the high-pressure fluid side for producing pressure variations in a fluid in the negative pressure generation groove. The at least one interference groovehas an endon an inside-diameter side extending to a position to radially overlap the negative pressure generation groove

Slide component

Growing community of inventors

Tokyo, Japan

Hiroshi Kubota