Shimadzu Corporation

Nihon Denshizairyo Kabushiki Kaisha

Nidec Corporation

Japan Electronic Materials Corporation

Hiroshi Iwata

Masao Okubo

Kazumasa Okubo

Kotaro Kataoka

Takamitsu Suzuki

Takahiro Nishimoto

Eiichi Ozeki

Hiroomi Goto

Ippei Takeuchi

Yasuko Yoneda

Kouji Katahira

Masaru Nomura

Nobuyuki Murakami

Shigehiko Zoda

Aline Rotzetter

Provided are a flow path device capable of rapidly performing a drug sensitivity test, and a testing device and a testing method using the same. A flow path device adjusted for observing a test solution existing in a well plate having a well includes: a plate-shaped main body having a main surface; and an insertion body provided in the main body, the insertion body extending along a direction perpendicular to the main surface of the main body, the insertion body configured to be inserted into the well. The insertion body includes a pore having a dimension capable of sucking up the test solution in the well, and the main body includes an observation flow path which communicates with the pore and extends along a direction in plane with the main surface of the main body.

Flow path device, and testing device and testing method using same

A microorganism recovering method high in recovering efficiency is provided. A microorganism recovering method of recovering microorganisms from a liquid sample includes filtering out microorganisms from the liquid sample through a filtration apparatus, the filtration apparatus including a first end and a second end, the filtration apparatus being configured to receive the liquid sample at the first end and being configured to discharge from the second end filtrate generated through the filtering out microorganisms and recovering the microorganisms filtered out by the filtration apparatus together with a culture medium by feeding the culture medium from the second end to the first end.

Microorganism recovering method and microorganism recovering apparatus

A testing method using a micro flow path device configured for a test liquid containing a specimen to be brought into contact with a drug therein and for a test on an action of the drug on the specimen includes: preparing the micro flow path device including: a plurality of micro flow paths, first and second openings which are disposed at both ends of each of the plurality of micro flow paths and communicate with an outside, a storage unit which is provided in each of the plurality of micro flow paths and stores the drug, and a gas-permeable membrane covering the first opening; applying a fluid pressure higher than an external pressure to the test liquid through the second opening from a syringe pump connected to the second opening to pressure-feed the test liquid to the storage unit; and observing a target region set in the micro flow path.

Micro flow path device, testing method using micro flow path device, and testing apparatus using micro flow path device

In a recovery device, a removing target such as a blood cell is removed from a liquid sample in a sample container using a first filter unit, and a microorganism is filtered from the liquid sample using a second filter unit. A controller causes a first switch to block a flow channel in response to a sensor detecting a bubble. A medium flows from a second connection unit of the second filter unit toward a first connection unit. Thus, the microorganism filtered by the second filter unit is recovered by a recovery container together with the medium.

Preprocessing device, preprocessing method, and non-transitory computer readable medium storing program

A power supply device is provided with an output unit, an input unit, a rectifier circuit, a switching circuit, and a controller. The input unit inputs an AC input. The rectifier circuit has a smoothing capacitor and converts the AC input into a rectified output. The switching circuit switches between an ON-state in which input impedance is low and an OFF-state in which input impedance is higher than that in the ON-state. The controller sets a modulation ratio such that, when controlling the switching circuit to switch between the ON-state and the OFF-state, at least a portion of a period, in which the modulation width of the modulation duty ratio becomes maximum, is included in a period from a time when an input current inputted to the smoothing capacitor is generated to a time when the voltage of the smoothing capacitor reaches a maximum value.

Power supply device, driving device, control method, and storage medium

A driving device is provided with an output unit, an input unit, a rectifier circuit, a switching circuit and a controller. The input unit inputs an AC in put. The rectifier circuit has a smoothing capacitor and converts the AC input into a rectified output. The switching circuit switches between an ON-state in which input impedance is low and an OFF-state in which input impedance is higher than that in the ON-state. The controller sets a start timing such that, when controlling the switching circuit to switch between the ON-state and the OFF-state, at least a portion of a period, in which the start timing of a power supply period becomes a second timing, is included in a period from a time when an input current inputted to the smoothing capacitor is generated to a time when the voltage of the smoothing capacitor reaches a maximum value.

Motor driving device, control method for motor driving device, and storage medium

Purpose: To present a vertical probe card capable of reusing without replacing a broken probe if a probe is broken. Constitution: A vertical probe card having vertical probes, being used in measurement of electric characteristics of an LSI chipto be measured, comprising a main substrateforming conductive patterns, a plurality of probesdrooping vertically from the main substrate, and a probe supportprovided at the back side of the main substratefor supporting the probes, in which the probe supportis disposed parallel to the main substrate, and has an upper guide plateand a lower guide platefor supporting the probesby passing the through-holesopened in each, and the lower guide plateis composed of three substratesA,B,C laminated separably.

Vertical probe card

A first assembly configuration features in including: a plurality of probes having a buckling portion to buckle, upon a contact by an end of a contact portion onto an electrode of semiconductor integrated circuit; a first board provided with a first wiring pattern connected with a connecting portion of the probe; a second board removably fastened with the first board and provided with a second wiring pattern connected with the first wiring pattern; housing members mounted with the second board for holding the contact portion of the probe. Next configuration features in including: two kinds of probes; measurement probes and connection probes anew, and a plurality of connection probes include buckling portions to buckle, upon a contact by an end of contact portion onto the wiring pattern provided with the first board when inserted into holes provided with the a second board; wherein through holes provided with the second board are positioned to align to the arrangement of wiring pattern provided with the first board. Thereby, undesirable deviation of contact point by the probe is avoided and a suitable contact pressure is preferably kept, and further convenience in the work of exchanging damaged probes is brought about.

Probe, manufacture of same, and vertically operative type probe card assembly employing same

Probe for testing a semiconductor integrated circuit

A method of reforming a tungsten probe tip includes forming a non-oxidizing metallic film on the surface of the tungsten probe tip, heating the film in a non-oxidizing atmosphere or vacuum, and diffusing the film into the tungsten probe tip. The non-oxidizing metallic film can be formed from a metal such as gold, platinum, rhodium, palladium, and iridium. The reformed tungsten probe tip can be used in low voltage and low current testing, and has excellent abrasion resistance, conductivity and oxidation resistance.

Method of reforming a tip portion of a probe

Probe card is a part which is incorporated into a probing equipment to test finished IC chips, This card is customarily mounted with a plurality of probes, very fine needle and generally bent, and each probe is disposed so that its front end may pinpoint to a pad of an IC chip of interest. In performing the probing test, a most important condition is to keep the probe contact pressure on the pad of an IC chip at a constant position during measurement time, but in performing such at a high temperature, heated IC chips radiate the probe card and thereby positional deviation of the contact point is caused by heat expansion of the probe card and hence the contact pressure may change. The invented probe card employs a ceramic material in fabricating the probe card for possessing a very low expansion coefficient or for possessing an equivalent coefficient value to the IC chip or wafers, thereby the positional deviation of the probe contact is avoided and other devices to cope with difficulties caused by performance at a high temperature are disclosed.

Growing community of inventors

Kyoto, Japan

Hiroshi Iwata