Matsushita Electric Industrial Co., Ltd.

Panasonic Corporation

Matsushita Eco Technology Center Co., Ltd.

Hitachi High-tech Science Corporation

Hiroshi Iwamoto

Takao Hisazumi

Yoshiyuki Tani

Ryuichi Murai

Masahiro Ito

Kiyoshi Hasegawa

Shigeo Nakatera

Yukihiro Iwata

Shin-ichiro Hatta

Etsuyoshi Sakaguchi

Masaki Kawasaki

Tetsuro Ozawa

Shinichiro Hatta

Tomohisa Mikami

Yuji Maniwa

Kaoru Shimizu

Fumio Yamazaki

Koji Matsuo

Yutaka Nishimura

Atsushi Kohama

Noboru Aikawa

Takayuki Yonezawa

Takao Ono

Hiroyuki Tokumasu

Norie Araki

Toshiaki Koga

Shouichi Irie

Takehiro Miyoshi

Tokuhisa Komatsu

Hirofumi Iwakawa

Toshio Shimamura

Masashi Kawasaki

Futoyoshi Morimoto

Teruo Gotou

Hiroshi Nakano

Hideki Yamamoto

Mitsuo Suzuri

A glass cutting apparatus () includes a pair of cutters () installed oppositely to each other in such a way as to sandwich, therebetween, a glass plate with surfaces of the glass plate thereof being along a vertical direction; a first pressing unit () which presses one of the cutters to one of the surfaces of the glass plate in a horizontal direction with a pressing force P; a second pressing unit () which is placed oppositely to the first pressing unit and presses the other one of the cutters to the other surface of the glass plate in the horizontal direction with the pressing force P; and a moving unit () which moves the pair of cutters pressing the glass plate with the pressing force P.

Glass cutting apparatus, glass-substrate disassembling apparatus, glass-substrate disassembling system, glass cutting method, and glass-substrate disassembling method

In the present disclosure, before disassembly of liquid crystal module () having liquid crystal panel () and a back light, irradiation is performed with X-rays () from the front surface side of liquid crystal panel () of liquid crystal module (). By this irradiation with X-rays (), generated fluorescent X-rays () are detected to analyze an element contained in liquid crystal panel (), while X-rays () backscattered or transmitted to the rear surface side of liquid crystal module () are detected to determine a type and a state of the back light. Then, based on the determined type and state of the back light, liquid crystal module () is disassembled.

Method for disassembling liquid crystal display device

In the disassembling method of a display device of the present invention, the display device has a display panel, and metal plate unit having a panel member formed of a chassis member disposed on the back surface of the display panel and a circuit board as an electric circuit member attached to the chassis member through an attaching member. The disassembling method has a mounting step of mounting metal plate unit on stage whose tilt angle can be adjusted by mechanism section and a cutting step of cutting the attaching member in parallel with the surface of stage with saw blade that abuts on the attaching member by the own weight of metal plate unit based on the tilt angle of stage.

Method and apparatus for disassembling display device

A metal identifying device precisely identifies a metal material in a metal member having a plurality of through-hole portions penetrating through the metal member. The metal identifying device of the present invention includes a measurement unit that obtains a measurement value by measuring an electrical property and/or optical property of a test object, a threshold value determination unit that determines a threshold value with use of a reference value obtained by measuring the property of a metal member having a metal composition to be identified and information indicating a ratio of the through-hole portions to a measurement area in the test object and/or information indicating a configuration of the through-hole portion, and a comparison/identification unit that identifies a metal composition of the test object by comparing the measurement value and the threshold value.

Metal identifying device and metal identifying method

A method and apparatus for efficiently removing a dissimilar material as part of a recycling process, which are free of problems in the terms of worker safety and the work environment, are provided. With the apparatus of the present invention, a working unit is operated to move a blade unit while pressing a plastic product from the outside thereof to punch out the dissimilar material.

Method and apparatus for removing a dissimilar material

An object of the present invention is to shorten the time required by processing, and to simplify the work and increase the number of samples processed, in the X-ray analysis of a specific substance contained in a sample. To achieve the object, a method for assaying the content of a specific substance in a sample, comprises a measurement step (S) of irradiating the samplewith X-rays, and measuring the spectrum of the sample, and an assay step (S) of comparing the components of the specific substance in the spectrum of the sampleand in a reference spectrum that has been pre-stored for the sample, and determining whether the specific substance is contained in the samplein an amount equal to or greater than a specific value.

X-ray fluorescence analysis to determine levels of hazardous substances

In a fluorescent X-ray analysis method, a sample () is set on a sample stage () on an upper side of an X-ray irradiation chamber () and a sample cover () is closed from the upper part of the sample () to surround the sample (), and then, a lower plane of the sample () is irradiated with X-ray for analysis. When the sample () is set on the sample stage () and the sample cover () is closed, a cover detecting means () detects that the sample cover () is closed and X-ray is automatically projected from an X-ray source () to start analysis.

Fluorescent X-ray analysis method and device

A plastic identifying apparatus according to the present invention identifies the kind of plastic in an object to be identified by using as an identification face at least two faces of a test piece () serving as the object to be identified. The plastic identifying apparatus according to the present invention includes an identifying and detecting portion () for identifying the kind of the plastic included in the test piece () and a toppling system () for toppling the test piece () by applying an external force to the test piece () in order to change the identification face of the test piece () facing the identifying and detecting portion () from a first face () to a second face ().

Plastic identifying apparatus and plastic identifying method

It is possible to solve the problem of the conventional fluorescent X-ray analysis that a concentration calculation result can be obtained only after elapse of a time set as a measurement time. In the fluorescent X-ray analysis method and fluorescent X-ray analysis device according to the present invention, a sample measurement condition is set before starting the measurement and the measurement concentration of the element contained in the sample and the measurement accuracy are calculated. When the measurement accuracy has become a value satisfying the predetermined measurement condition, the measurement is terminated and the concentration at that moment is outputted.

Fluorescent x-ray analysis method and fluorescent x-ray analysis device

The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions.

Fluorescent X-ray analysis method and fluorescent X-ray analysis apparatus

A plastic identifying method of the present invention is provided with a step (i) of obtaining a first infrared absorption spectrum by irradiating infrared light of a predetermined wave number onto an item to be identified that contains plastic and measuring the intensity of the infrared light that is totally reflected by this item, and a step (ii) of identifying the plastic contained in the item to be identified by matching the first infrared absorption spectrum with a group of infrared absorption spectra that have been measured for predetermined materials, wherein the predetermined materials are a group of materials containing plastics, and each infrared absorption spectrum in this group of infrared absorption spectra is obtained by irradiating infrared light of a predetermined wave number onto a predetermined material, and measuring the intensity of the infrared light that is totally reflected by that material, and matching is carried out by comparing peaks in the first infrared absorption spectrum with peaks in each infrared absorption spectrum in the group of infrared absorption spectra. With this plastic identifying method, items that contain plastic can be identified accurately, even in such cases as when the items have been colored or contain additives or the like.

Plastic identifying method

A plastic identifying apparatus of the present invention is provided with a sampling unit () that samples a test piece () from an item to be identified that contains plastic; an identifying unit () provided with a detection unit () that identifies a type of plastic contained in the test piece (); and a supply unit () that supplies the test piece () from the sampling unit () to the detection unit (). With this plastic identifying apparatus, it is possible to realize a plastic identifying method of the present invention, and to identify the types of plastics contained in items to be identified with good accuracy, and continuously, regardless of the size of the items.

Device and method for identifying plastic

A cathode ray tube is provided, in which the flatness of a tension mask constituting a color-selection mechanism is maintained by a suitable stretching force, while with the tension mask, the influence of external magnetic fields, such as the terrestrial magnetism is suppressed, and the shifting of the electron beam is reduced. A tension mask made of a magnetostrictive material is used, the tension mask is stretched by a stretching force in a range maintaining the flatness of the tension mask, and the direction and strength of the stretching force are set such that vertical magnetic permeability of the tension mask increases, due to a magnetoelastic effect caused by the stretching force in the magnetostrictive material of the tension mask.

Cathode ray tube tension mask made of magnetostrictive material with compensation for terrestrial magnetism

In the structure of the present invention, there can be provided a cathode ray tube in which deviation in the trajectory of the electron beams by the leakage magnetic field from the mask frame ( ) is decreased by using a polygonal mask frame ( ) in which the relative magnetic permeability of longer side members ( ) out of two side members adjacent to each other at the joint portion of the mask frame ( ) is the same as or larger than the relative magnetic permeability of the other side members ( ). Thus, the significance of the present invention in industrial terms is large.

Cathode-ray tube

An inner magnetic shield is provided that reduces mislanding lengths due to electron beam distortion caused by external magnetic fields such as terrestrial magnetism, thereby reducing the occurrence of drifted or uneven color throughout an entire display screen. The inner magnetic shield is of a tube with a plurality of side surfaces, and is provided with at least one skirt ( ) that extends to the vicinity of a spanning member ( ) at a location where the inner magnetic shield is not in contact with a holding member ( ). The skirt ( ) is magnetically coupled with the spanning member ( ).

Growing community of inventors

Osaka, Japan

Hiroshi Iwamoto