Shimadzu Corporation

Hiroshi Arai

Masato Hirade

Kazuma Watanabe

Kenji Yamasaki

Keita Fujino

Hideo Nakajima

Yuichiro Ikeda

Akinori Kogure

Eiji Iida

Masahiro Ohta

Provided is a technique for making a user analyze a sample while providing convenience to the user. An information providing system is provided with a determination unit configured to determine whether or not the part needs to be replaced, a display unit, and a display control unit configured to control the display unit. The display control unit causes the display unit to display supplier information on a supplier of the part when the part needs to be replaced.

Information providing system, server device, and analyzer

A cantilever has a probe at a tip end. An optical system emits laser light to the cantilever and detects the laser light reflected by the cantilever. A measurement unit measures characteristics of a sample based on a displacement of the cantilever obtained by a change in a position of the laser light detected by the optical system. The laser light adjustment unit adjusts, when adjusting the optical axis of the laser light, a spot diameter of the laser light to be larger than the spot diameter when measuring the characteristics of a sample. The imaging unit captures an image of a range including the position of the probe when adjusting the optical axis of the laser light. The display unit displays the captured image.

Scanning type probe microscope and control device for scanning type  probe microscope

A scanning probe microscopeis provided with a control unitThe control unitincludes a signal acquisition processing unitan image acquisition processing unita scanning condition change processing unita scanning processing unitand a noise determination processing unitIn the scanning probe microscopewhen removing noise included in a surface image of a sample, the scanning condition change processing unitchanges a scanning condition. And, the signal acquisition processing unitacquires an output signal from a detection unitThe image acquisition processing unitacquires a surface image of a sample S based on the output signal. The noise determination processing unitdetermines whether or not noise is inclined in the output signal contains noise based on the change in the output signal or the change in the surface image of the sample S when the scanning condition is changed by the scanning condition change processing unitTherefore, if noise is included in the output signal, it is possible to correctly determinate the fact.

Scanning probe microscope and analysis method

A holding member, a sample container, and a mounting member are used in a scanning probe microscope. The mounting member is made of an elastically deformable material such as a rubber material. The mounting member includes an annular main body. When the mounting member is mounted on the holding member and the sample container, the holding member is inserted into the sample container while the main body of the mounting member is elastically deformed along an outer circumferential surface of the sample container. One end of the mounting member is detached from the outer circumferential surface of the sample container, and brought into close contact with an outer circumferential surface of the holding member. When the holding member and the sample container are relatively moved, the main body of the mounting member is elastically deformed.

Sample container mounting member and sample container sealing method

When trace image data is obtained while a probe is used to scan a region on a sample in a forward direction and retrace image data is obtained while the same region is scanned in the reverse direction, a deviation information storage unit stores deviation detected by a deviation detection unit. This deviation is an indication of the difference between the distance between the probe and the sample and a target value for the distance at a given point in time. An image data selection unit compares the deviation during forward scanning and the deviation during reverse scanning for each measurement point, selects the image data obtained during scanning that has the smaller deviation, and stores the same to a storage region of an image data storage unit as selected image data.

Scanning probe microscope

Provided is a scanning probe microscope being able to shorten an observation time of a minute observation object. Main measurement is performed to acquire a surface image of a sample based on a detection signal in a measurement range of a plurality of lines by repeating, for each line, processing of scanning a cantilever at predetermined second intervals in a Y-direction after acquiring the detection signal at predetermined first intervals while scanning the cantilever on a line having a predetermined length along an X-direction. Preliminary measurement is performed to acquire a surface image of the sample by acquiring the detection signal at intervals wider than the first intervals or scanning the cantilever in the Y-direction at intervals wider than the second intervals before the main measurement, the surface image of the sample being coarser than the surface image in the main measurement.

A scanning probe microscope includes a light source, a detector, a housing, an opening and closing door, an opening and closing sensor, a control unit, and the like. The opening and closing door is provided in the housing. The control unitalso functions as the light intensity change processing unit. In the scanning probe microscope, when the opening and closing sensor detects opening and closing of the opening and closing door, the light intensity change processing unit automatically changes the intensity of light irradiated from the light source based on a detection result of the opening and closing sensor. Therefore, it is possible to omit light intensity adjustment work performed manually by the user. As a result, the workability of the user when using the scanning probe microscopecan be improved.

Scanning probe microscope and light intensity adjusting method

A sample holder includes a sample container and a fixing member. The fixing member is inserted into the sample container in a state in which a sample is placed, and fixes the sample by sandwiching the sample between the fixing member and a bottom surface of the sample container. At this time, a peripheral edge portion of the fixing member is elastically deformed by being inserted into the sample container, and the fixing member sandwiches the sample by its elastic force. Therefore, even when the sample is placed in the sample container in the state of being immersed in a liquid, the sample can be held in a stable state by the fixing member.

Sample holder, fixing member and method for fixing sample

A data display processing device for a scanning probe microscope includes: a group information storage unit for managing and storing a plurality of measurement data sets; specified data acquisition means for acquiring, from the storage unit, a specified measurement data set; display controlling means for displaying the specified data set as an image; preliminary image generation means for, triggered by determination of the specified data set, acquiring other measurement data set or sets belonging to a group including the specified data set from the group information storage unit, and generating a preliminary image which is an image or images which will be used when displaying the other measurement data set or sets; and first display switching means for switching to display the preliminary image within a predetermined region in response to a first predetermined input operation by the user performed while the specified data set is displayed.

Growing community of inventors

Kyoto, Japan

Hiroshi Arai