Adv Antest Corporation

Molex Japan Co., Ltd.

Hiromitsu Takasu

Hiroyuki Hama

Akinori Mizumura

Shin Sakiyama

Kyoko Oniyama

Hiroyuki Mineo

Each of the signal terminal and the ground terminal includes a first extending portion extending toward its tip end, and a second extending portion extending in a direction opposite to the first extending portion. The first extending portion is formed such that a width thereof is smaller than a width of the second extending portion. The housing includes a first housing into which the first extending portions are inserted, and a second housing into which the second extending portions are inserted. The second housing is formed separately from the first housing, and the first housing includes a wall portion located between the first extending portion of the signal terminal and the first extending portion of the ground terminal.

Connector and semiconductor testing device including the connector

A connector includes a first terminal. The first terminal includes a movable portion, and the movable portion has, on its tip side, a contact portion located on a course C of a case assembly. Further, the first terminal includes a fixed portion restricted from moving and located on a base side of the movable portion. The movable portion is elastically deformable to incline toward a side surface of an insertion hole while using the fixed portion as a fixed point. Further, the movable portion includes a hit portion between the contact portion and the fixed portion. The hit portion is located apart from the side surface of the insertion hole, and the hit portion is provided capable of hitting, midway during inclining of the movable portion toward the side surface of the insertion hole, against the side surface of the insertion hole.

There is provided a semiconductor testing apparatus having a test head body having signal modules for processing the test signals, a plurality of connection cables electrically connected with the signal module and having connector pins at their ends, a plurality of types of connector housings for holding a plurality of connector pins, an interface plate having a plate body disposed on one face of the test head body and a plurality of connector blocks removably attached respectively to the plate body while storing a plural number of connector housings of either type among the plurality of types and a performance board for removably holding the electronic device and for electrically connecting the plurality of connector pins to the electronic device by being attached to the interface plate.

Growing community of inventors

Tokyo, Japan

Hiromitsu Takasu