Hitachi, Ltd.

Ricoh Company, Ltd.

Hitachi High-Tech Corporation

Hiromitsu Nakagawa

Keiro Muro

Takeshi Tanaka

Daisuke Fukui

Katsuhiko Mukai

Tomohiro Nakamura

Katsuro Kikuchi

Yasuhide Mori

Takashi Toyomura

Yoshiko Nagasaka

Qi Xiu

Takashi Negishi

A motion visualization systemincludes a skeleton recognition programobtaining joint coordinates of a target person, a pitch extraction programextracting a walk cycle of the target person based on the joint coordinates, and a storage unitstoring a skeleton normalization programtransforming coordinates of the joint coordinates in a reference coordinate system where a direction in which a predetermined portion of the target person moves is set as an axis of a traveling direction in one walk cycle extracted and transforming the joint coordinates based on information on the target person.

Motion visualization system and the motion visualization method

Provided is a measurement apparatus including a processor and a storage unit. The storage unit holds measurement data of each time point which is obtained by a photographing apparatus, and temporal-spatial constraints. The processor extracts a position of an object from the measurement data of each time point, determines whether the object satisfies the temporal-spatial constraints, and determines, based on a result of the determination on whether the object satisfies the temporal-spatial constraints, whether the object is an analysis target.

Measurement apparatus and measurement method

A traceability system includes: a Equipment table that stores production data of a product manufactured in a first process, in which an individual ID is appended to a product; a Equipment table that stores production data of a product manufactured in a second process, in which an individual ID is not appended to a product; a training data setting unit that creates a training data table that stores the Equipment table and the Equipment table, which are correlated with each other; a feature amount extracting unit that calculates a cycle time of a predetermined number of products manufactured in the past in the first process; a model creation section that creates a production time estimation model for estimating a production time at which a product has been manufactured in the second process on the basis of the cycle time of the products; and a production time estimating unit.

Traceability system and method for traceability

An analysis control device controls an analysis based on time series data for each of a plurality of sensors corresponding to a plurality of components that constitute a target device. The analysis control device acquires sensor data sets belonging to an analysis target time zone among the time series data of each of the plurality of sensors. Each sensor data set includes measurement values measured by a sensor. The analysis control device calculates an evaluation value according to a simple evaluation by using two or more sensor data sets corresponding to the sensor among the plurality of sensor data sets belonging to the analysis target time zone. The analysis control device sets an execution order of the analysis based on the measurement values of the sensor within a restricted time corresponding to the analysis target time zone in a descending order of the calculated evaluation value.

Time series data analysis control method and analysis control device

The analysis system executes an analysis process which takes as input data at least portions of: time series data of a plurality of instances of value data which each include times and values; and analysis data which includes data which has been outputted by previous analysis processes. Each of the one or more objects is a process definition conforming to a user operation. In the analysis process, the analysis system skips at least one of: an execution of a process conforming to an object which matches any previous object; an execution of a process conforming to an object for a scope block and process description, among a plurality of scope blocks which constitute the scope to be analyzed, which match a scope block and process description which are associated with any stored data block; and/or the storage of a data block which matches any stored data block.

Analysis system and analysis method for executing analysis process with at least portions of time series data and analysis data as input data

An event flow system connecting nodes, for which processes are defined, from an upstream side to a downstream side by an event which is generated due to a certain process and is used by another process to realize a process flow is provided. The event flow system includes: a process flow builder configured to build a process flow using a plurality of nodes, one or more events, and a reverse event that sends a predetermined request, from a downstream node to an upstream node disposed further toward an upstream side than the downstream node; and a process flow executer configured to execute a process defined for each of the plurality of nodes according to the event and the reverse event.

Event flow system and event flow control method

Model data is generated from performance information sorted by day of the week, time period, and process status by a performance information analysis section and a process status analysis section. An abnormality determination section detects abnormality using appropriate model data. What the graph of an expected status is like, how much the graph of the current status that has been determined abnormal differs from the graph of the expected status, and how much the current status is like the expected status are displayed allowing a system manager to observe detailed information about abnormality determination.

Abnormality detection method, device and program

A solder joint determination method is disclosed that is able to inspect a joint portion between an electrode and a soldered portion and determine a soldering condition of the joint portion reliably with high precision. The method includes the steps of: scanning a surface of the electrode with the light beam; detecting a height of the electrode relative to the circuit board from data of the scanning of the electrode; scanning a surface of the solder near the electrode with the light beam; detecting a height of the solder relative to the circuit board from data of the scanning of the solder; and determining the solder joint condition between the electronic part and the solder based on the height of the electrode and the height of the solder relative to the circuit board.

Solder joint determination method, solder inspection method, and solder inspection device

A method for assembling and testing an electronic circuit baseboard includes at least a step of soldering at least one electronic part to an electronic circuit baseboard using Pb excluded solder. One of erroneous wiring, erroneous mounting, malfunction, and defective soldering of the least one electronic part is tested by contacting a probe pin to various probe pin contact sections on the electronic circuit baseboard. During the step of soldering, the Pb excluded solder is also supplied to at least one of the various probe pin contact sections in order to suppress oxidation thereof.

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Tokyo, Japan

Hiromitsu Nakagawa