Nitto-denko Corporation

National Institute of Advanced Industrial Science and Technology

Hiromichi Ohashi

Kazuo Kitada

Tomokazu Yura

Atsushi Hino

Naoyuki Matsuo

Kanji Nishida

Takaichi Amano

Kyungmin Sung

Masamu Kamaga

Yoshihiro Kameda

Mitsuaki Shimizu

Shinichi Nishizawa

Akira Nakajima

Yukihiko Sato

Moe Imaizumi

Kosuke Sato

The present invention provides a semiconductor device that prevents destruction due to an avalanche breakdown and that has a high tolerance against breakdown by configuring the device so as to have a punch-through breakdown function therein and such that the breakdown voltage of a punch-through breakdown is lower than an avalanche breakdown voltage so that an avalanche breakdown does not occur.

Semiconductor device

To realize power supply to each gate drive circuit without using an individual dedicated power supply for each gate drive circuit. A power conversion apparatus includes an individual drive unit that does not require a dedicated power supply, and includes gate drivers connected to switches and interface circuits and a power converter gate drive configured with a common power supply for supplying power to the gate drive unit. Power is supplied from main circuits or a number of common power supplies fewer than that of the number of the switches through one or more power supply terminals included in the interface circuit. Also, the signal can be transmitted by isolation from a signal source to the gate drivers.

Power conversion apparatus with M conversion levels having an individual drive unit that does not require a dedicated power supply

A power conversion apparatus includes a main circuit with switches, and performs power conversion to generate power to a three-phase AC load from a three- or single-phase AC power supply. Some of the switches are configured, using a bidirectional switch including a normally-on device that is turned OFF when a gate circuit is provided with a positive or negative voltage, and a normally-off device that is turned ON when the gate circuit is provided with a positive or negative voltage, to provide only a specific unidirectional current flow when the gate circuit is not activated, and when the gate circuit is activated, provide and control a bidirectional current flow to direct only in an arbitrary unidirectional way. By providing the power conversion apparatus with a capability of directing back, to a load (motor), any power coming therefrom, the conversion apparatus requires no direct-current link capacitor and a diode clamping circuit.

Power conversion apparatus

The test data processing apparatus of the present invention is a test data processing apparatus for processing test data obtained by testing defects of a sheet-shaped product having at least an optical film which is a member of an optical displaying apparatus, comprising a defect information preparing section, wherein, on the basis of surface defect test data relating to a surface defect and bright point test data relating to a bright point obtained when the optical film or a laminate body containing the optical film is regarded as an object of testing, in a case that a position of the surface defect and a position of the bright point are identical, the surface defect and the bright point located at the identical position are not regarded as a defect for processing by the defect information preparing section.

Test data processing apparatus and test data processing method

A defect testing apparatus for testing defects of optical film sheet-shaped product of an optical displaying apparatus, which includes a defect detecting means for detecting defects of a monolayer body and/or a laminate body constituting the sheet-shaped product in a state in which a protective layer on a surface of the sheet-shaped product is not disposed and defect information preparing means for preparing defect information which is information related to the defects detected by the defect detecting means, and the defect information is used for producing the sheet-shaped product provided in a roll form or in separate sheets.

Apparatus for testing defects of sheet-shaped product having optical film, apparatus for processing test data thereof, apparatus for cutting the same, and production thereof

A first inspection process of inspecting presence of a defect on a front surface of a film body with a protective film separated therefrom; a separator removing process of separating a separator from the inspected laminated film; a second inspection process of inspecting presence of the defect in the film body in a vertical attitude while introducing the film body with the separator separated and removed therefrom to a film travel path directed in a vertical direction, and storing detection data; a separator laminating process and a protective film laminating process of laminating a separator and a protective film to a back surface and a front surface of the inspected film body, respectively; and a film collecting process of winding up the inspected laminated film laminated with the protective film and the separator are provided.

Laminated film defect inspection method and laminated film defect inspection device

A strip-shaped polarizing film has a protective film strip conformably adhered to one surface thereof and a releasable liner conformably adhered to the other surface thereof and delivered from a film delivering station. After an appearance inspection, a lamination of the protective film strip and the polarizing film strip F is half-cut using a laser unitto form an array of laminations each consisting of a protective film and a polarizing film F, with the releasable liner being left intact. Then, the polarizing films F are fed to a peeling mechanism. The peeling mechanismfeeds a forwardmost one the polarizing films F to a laminating mechanismwhile peeling off the releasable liner therefrom by a knife-edged member. The forwardmost polarizing film F is laminated to a liquid-crystal panel W conveyed to the laminating mechanism by a panel transport apparatusin synchronization of the feeding of the forwardmost polarizing film F.

Growing community of inventors

Ibaraki, Japan

Hiromichi Ohashi