Canon Kabushiki Kaisha

Rigaku Corporation

Kabushiki Kaisha Toshiba

Riken Corporation

Hiroki Yoshida

Kazumi Kimura

Yoshihiro Ishibe

Genichiro Kudo

Hiroto Kano

Hiroyuki Hamano

Takahisa Sato

Kensaku Hamada

Akihito Yamano

Hiroshi Sato

Takaaki Ishii

Masayuki Sakanishi

Keiichi Morikawa

Makoto Hoshino

Motohide Yoshimura

Keiichiro Ishihara

Hiroki Nakayama

Osamu Kurokawa

Akihiro Himeda

Shoichi Yasukawa

Tsutomu Inaba

Akito Sasaki

Optical system includes front group, light-shielding member, and rear group that are arranged in this order in direction from object side toward image side. The light-shielding member is provided with opening elongated in first direction. The front group has aspherical surfaces, does not image the object at the opening in first section parallel to the first direction, and forms intermediate image of the object at the opening in second section perpendicular to the first direction. The rear group has diffractive surface that splits light beam that passes through the opening into light beams at different wavelengths in the second section and focuses the light beams on different locations in the second section. Tilt angles of the aspherical surfaces in the second section change in the first direction.

Optical system, and imaging apparatus and imaging system including the same

An optical systemincludes a front group, a light shielding member, and a rear groupdisposed in order from a side of an object to a side of an image. The light shielding memberhas an opening. The rear grouphas a diffraction surfaceand an aspherical surface. The aspherical surfacein a first section has a non-circular-arc shape. The grating spacing of the diffraction surfacein the first section changes from a center portion toward a peripheral portion to include an extremum value at the center portion. In the first section, the shape of at least one of a base surface of the diffraction surfaceand an optical surface disposed closer than the diffraction surfaceto the side of the object is asymmetric with respect to a normal line at a vertex thereof.

Optical system, imaging apparatus including optical system, and imaging system

Optical system includes a front group, light-shielding member, and rear group that are arranged in this order in direction from object side toward image side. The light-shielding member is provided with opening elongated in first direction. The front group does not image the object at the opening in first section parallel to the first direction and forms intermediate image of the object at the opening in second section perpendicular to the first direction. The rear group has diffractive surface that splits light beam that passes through the opening into light beams at different wavelengths in the second section and focuses the light beams on different locations in the second section. Light beam that is emitted from the front groupand that enters the opening is non-parallel light in the first section.

Optical system includes front group, light-shielding member, and rear group that are arranged from object side toward image side. The light-shielding member is provided with opening elongated in first direction. The front group has aspherical surface, does not image the object at the opening in first section parallel to the first direction, and forms intermediate image of the object at the opening in second section perpendicular to the first direction. The rear group has diffractive surface that splits light beam that passes through the opening into light beams at different wavelengths in the second section and focuses the light beams on different locations in the second section. The curvature radius of the aspherical surface in the second section at on-axis position in the first direction differs from that at outermost off-axis position in the first direction.

A scanning optical system manufacturing method includes receiving a scanning beam, emitted from a scanning unit including an incident optical system and a deflecting device and passed through an image-forming optical system, in an area having a width in the main scanning direction narrower than a spot diameter of the scanning beam by a light-receiving unit configured to be capable of being displaced at each image height position in the main scanning direction, calculating, based on an output of the light-receiving unit, a peak light quantity at each image height position of the scanning beam, smoothing distribution data of the peak light quantity at each of the image height position acquired by the calculating, and determining, based on the data acquired by the smoothing, either nondefective/defective states of the scanning unit and the image-forming optical system or a nondefective/defective state of only the image-forming optical system.

Method and apparatus for inspecting scanning beam of scanning optical system

An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the apparatus having: measurement software for implementing each of the individual measurement methods and acquiring measurement data; analysis software for performing a predetermined analysis on the measurement data and acquiring analysis data; reduced-size-image-creating means for creating a reduced-size image on the basis of each item of the measurement data and the analysis data; analysis-icon-creating means for creating an icon for denoting the analysis software; and image display means for displaying the reduced-size image and the icon on the same screen while indicating that the reduced-size image and the icon are correlated.

X-ray analysis apparatus

Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks of the diffraction X-ray is counted, and analysis processing is started when the counted number of peaks reaches a preset peak number. The analysis processing is repetitively executed on the basis of X-ray diffraction measurement data. The peak positions and the integrated intensities of the diffraction X-ray are determined from the X-ray diffraction measurement data obtained from the start of the measurement till the analysis processing concerned, and qualitative analysis of collating the determined peak positions and integrated intensities with standard peak card data whose data base is made in advance and searching materials contained in a measurement sample, and quantitative analysis of determining the quantities of the materials contained in the measurement sample are executed.

Analysis method for X-ray diffraction measurement data

In a specific macromolecule crystal detecting method according to the present invention, ultraviolet light is irradiated to sample solution, and a fluorescent image emitted from a sample in the sample solution is detected to detect specific macromolecules in the sample solution. Furthermore, by detecting the outline of the sample from the visible light image of the sample contained in the sample solution, the crystal is discriminated from other materials on the basis of the outline. By integrating the detection results of the fluorescent image and the visible light image, the specific macromolecule crystal is detected from the sample solution.

Method of detecting specific polymer crystal

An optical scanning device having a deflector with an oscillating element wherein a relation 0.85&#x3c;(dY/d&#x3b8;)/(dY/d&#x3b8;)&#x3c;1.15 is satisfied throughout an effective scan region, where &#x3b8;is a deflection angle of the oscillating element as a light beam scans the center position Yof an effective scan region on a scan surface with respect to a main-scan direction, &#x3b8; is the deflection angle of the oscillating element as the light beam scans a scan position Y in the effective scan region with respect to the main-scan direction, dYis an amount of change at the center position Yon the scan surface with reference to an amount of change d&#x3b8;of the oscillating element at the deflection angle &#x3b8;, and dY is an amount of change at the scan position Y on the scan surface with reference to an amount of change d&#x3b8; of the oscillating element at the deflection angle &#x3b8;.

Optical scanning device and image forming apparatus using the same

A specific macromolecule crystal evaluating device according to the present invention is equipped with a sample detecting stage for detecting a protein crystal in a sample container, an X-ray measuring stage that is spaced from the sample detecting stage and carries out X-ray diffraction measurement of the protein crystal, a feeding unit for feeding the sample container from the sample detecting stage to the X-ray measuring stage, and a central processing unit for recognizing the position of the protein crystal on the basis of the information achieved in the sample detecting stage and controlling the feeding unit on the basis of the position information to position the protein crystal to a sample disposing portion of the X-ray measuring stage.

Apparatus for estimating specific polymer crystal

A light scanning apparatus capable of printing with a high quality and an image forming apparatus using the same are obtained. The light scanning apparatus is provided with an incidence optical system for guiding a light beam emitted from a light source part to a deflection part; an imaging optical system provided with a diffracting surface having a power at least in a sub-scanning section that guides the light beam deflected by the deflection part on a surface to be scanned; and a surface inclination correction function, in which a principal ray of the light beam is always positioned outside of a main scanning section during scanning. In the light scanning apparatus, each element is set so as to satisfy each conditional expression.

Light scanning apparatus and image forming apparatus using the same

A multi-beam scanning optical apparatus includes an incident optical system for making a plurality of light beams emitted from light source means having a plurality of light emitting portions incident on a deflector, and a scanning optical system for forming images of the plurality of light beams deflected by the deflector on a surface to be scanned. The scanning optical system has at least one scanning optical element made of a resin. The scanning optical element made of the resin has birefringence due to a stress distribution generated upon cooling in a molding process thereof such that the directions of principal axes of birefringence at one end portion of the scanning optical element are different from those at the other end portion, opposite to the one end portion with respect to an optical axis thereof in a main scanning direction, of the scanning optical element. An interval between adjacent scanning lines formed on the scanning surface by the plurality of light beams whose images are formed on the scanning surface through the scanning optical element made changes in the main scanning direction in an effective scanning region. In the apparatus, a sub-scanning interval error between the scanning lines due to a polarization angle difference between the light beams emitted from the plurality of light emitting portions is so set as to be not more than &#x2155; of a desired scanning line interval.

Multi-beam scanning optical apparatus and image forming apparatus using the same

In a multi-beam scanning optical system, when at least three light fluxes emitted from a light source having at least three light-emitting points are deflected and reflected on a deflection unit and guided to a surface to be scanned by a scanning optical unit, at least three light fluxes are entered into a deflection surface of the deflection unit at irregular angles within a main-scanning section and entered into the surface to be scanned at an angle within a sub-scanning section, and provided that a variation in lengths of scanning lines which is caused when each of the at least three light fluxes is entered into the surface to be scanned at an angle within the sub-scanning section is represented as &#x394;Y, a variation in lengths of scanning lines which is caused when each of the at least three light fluxes is allowed to enter as a non-parallel light flux to the deflection surface within the main-scanning section is represented as &#x394;Y, and a variation in lengths of scanning lines which is caused from a difference of wavelength between at least two of the at least three light fluxes is represented as &#x394;Y, values of &#x394;Y, &#x394;Y, and &#x394;Yare set so as to satisfy |&#x394;Y+&#x394;Y+&#x394;Y&#x3c;|&#x394;Y

Multi-beam scanning optical system, image forming apparatus, and color image forming apparatus

It is an object of the present invention to provide a multi-beam scanning optical system, which can reduce relative deviation of a writing position of each light-emitting portion due to focus deviation of a synchronization detection optical device, and an image forming apparatus using the same. In the multi-beam scanning optical system having the synchronization detection optical device including a light source device, an incident optical device, a deflection device, a scanning optical device and a slit, each element is set such that relative deviation of a writing position of each light beam due to deviation of a focus position within a main scanning cross section is reduced by a first light beam limiting element provided between the deflection device and the slit and a conditional expression is satisfied.

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Tochigi, Japan

Hiroki Yoshida