Nikon Corporation

Hiroki Yazawa

Fumihiro Dake

Shinichi Nakajima

Naoki Fukutake

Shigeru Nakayama

Tomoko Ujike

A model eye is disposed on a reference light path of reference light in a reference optical system so as to reflect or scatter the reference light at a model retina in order to form an interference optical system used to obtain interference light from the reference light of the reference optical system and signal light illuminated onto an examined eye in a signal optical system.

Ophthalmic device

A structured illumination microscopic device includes a first spatial modulation unit spatially modulating a fluorescent sample using an excitation light having a sinusoidal illumination distribution of a spatial frequency K and having an optical frequency &#x3c9;for shifting a fluorescent substance to an excitation level; a second spatial modulation unit spatially modulating the fluorescent sample using a stimulation light having a sinusoidal illumination distribution of a spatial frequency K and having an optical frequency &#x3c9;for shifting the excited fluorescent substance to a base level; and an imaging unit obtaining, as a modulated image, an image of the fluorescent sample with spontaneously emitted light generated at the fluorescent sample in accordance with the excitation light and the stimulation light.

Structured illumination microscopic device and structured illumination observation method

A super-resolution observation device includes an illumination optical system collecting a first illuminating light having a first optical frequency &#x3c9;on a first region of an observation object, collecting a second illuminating light having a second optical frequency &#x3c9;' on a second region partially overlapping the first region, and collecting a third illuminating light having a third optical frequency &#x3c9;on a third region containing a non-overlap region which is a region of the first region and does not overlap the second region; and an extraction unit extracting a signal light generated in accordance with a change in an energy level of a substance in the non-overlap region from a light generated in all of the first region, the second region, and the third region.

Observation device including illumination optical system and extraction unit and observation method

A super-resolution observation device includes an illumination optical system that focus a first illuminating light at optical frequency &#x3c9;and a second illuminating light at optical frequency &#x3c9;on a region of an observation object plane; a modulation unit that modulates a property of the first illuminating light heading toward the region at a modulation frequency f; and an extraction unit that extracts a component at the optical frequency &#x3c9;or &#x3c9;from a light generated in the region according to the first illuminating light and the second illuminating light, the component of which the property changes at a frequency higher than the modulation frequency f.

Super-resolution observation device and super-resolution observation method

A phase-contrast microscope system includes: an illumination optical system that illuminates a specimen with an illumination light from a light source; an imaging optical system that forms an image of the specimen from a light from the specimen; a first spatial modulation element that is disposed in a position of a pupil of the imaging optical system and changes an amplitude transmittance distribution of the light from the specimen; an image sensor that detects the image of the specimen by the imaging optical system and outputs a picture signal; a calculation section that calculates the amplitude transmittance distribution of the light from the specimen appropriate for observing the specimen on the basis of the output data detected by the image sensor and the amplitude transmittance distribution of the light from the specimen formed by the first spatial modulation element.

Growing community of inventors

Yokohama, Japan

Hiroki Yazawa