Renesas Electronics Corporation

Nissan Motor Company Limited

Kikkoman Corporation

Dainippon Sumitomo Pharma Co., Ltd.

Astrazeneca Aktiebolag

Hiroki Wada

Yoichi Maeda

Takeshi Hamamoto

Roger Victor Bonnert

Takashi Yoshikawa

Yoshiaki Isobe

Kazuki Hashimoto

Stephen Brough

Takahiro Kurosawa

Jun Matsushima

Mikio Nozaki

Takeharu Nakahara

Ayumu Kurimoto

Nobuaki Yokoyama

Ian Millichip

Thomas Mcinally

Junya Takeichi

Anna Hayashi

Tomoya Kamada

Kona Yamashita

An object of the present invention is to provide a fermented seasoning containing 5'-nucleotides derived from fermentation at a high concentration without externally adding 5&#x2032;-nucleotides and a method of producing the same. In a case where the nucleic acids are externally added, display of additives is indispensable on an ingredients description, and thus it cannot be said that the fermented seasoning have no chemical seasoning additive or made by natural brewing; however, with the fermented seasoning relating to the present invention, it is unnecessary to display additives on the ingredients description, and thus it is possible to appeal an added value to nature oriented or natural oriented consumers.

Nucleic acid-containing fermented seasoning and method of producing the same

A mounting structure for a power conversion device includes: a vehicle body component extending in a front-rear direction of a vehicle; a mounting component provided on the vehicle body component; a drive unit held by the vehicle body component via the mounting component; and a power conversion device attached to the mounting component. A stiffness of the mounting component is greater than a stiffness of the vehicle body component. The power conversion device is arranged between a front end and a rear end of the drive unit in a side view of the vehicle.

Mounting structure for power conversion device

A semiconductor device includes a FIFO, a test data write circuit that sequentially writes a plurality of test data to the FIFO in synchronization with a first clock signal, and a test control circuit that, in parallel with writing of the plurality of test data to the FIFO by the test data write circuit, sequentially reads a plurality of test data stored in the FIFO in synchronization with a second clock signal that is not synchronous with the first clock signal and performs a scan test of a circuit to be tested.

Semiconductor device and scan test method including writing and reading test data

A power-on self-test circuit and a pattern generation circuit are provided. The power-on self-test circuit includes a selection circuit and a comparator circuit. The selection circuit selects, instead of an external pin group corresponding to a test access port, an output of the pattern generation circuit when a self-diagnosis execution signal is asserted and supplies a test pattern generated by the pattern generation circuit to a built-in self-test circuit. The comparator circuit compares a test result of a circuit-under-test with an expected value. By asserting the self-diagnosis execution signal in this manner, the semiconductor integrated circuit mounted on a user system executes BIST.

Semiconductor integrated circuit and method for designing the same

Growing community of inventors

Kanagawa, Japan

Hiroki Wada