Toshiba Alpine Automotive Technology Corporation

Hiroki Shimizu

Keita Taniguchi

Hiromichi Yamamoto

Shingo Katagiri

A malfunction diagnosis apparatus includes: a first temperature detector; a second temperature detector that is placed in a different location from where the first temperature detector is placed; a difference value calculation device calculates a difference value between a detection value from the first temperature detector and a detection value from the second temperature detector; a mapping device carries out mapping of the difference value and calculates a correction value using the frequency of the difference value; a malfunction diagnosis device diagnoses whether or not there is a malfunction in the first temperature detector and the second temperature detector; and a recovery device calculates, as a detection value of the first or second temperature detector judged to be malfunctioning, a value by adding the correction value to a detection value from the first or second temperature detector judged not to be malfunctioning.

Malfunction diagnosis apparatus

According to one embodiment, there is provided an optical disc apparatus of a slot loading type, including a photosensor disposed near a disc insertion port and configured to change an output therefrom when an optical disc is inserted, a memory configured to record an output signal from the photosensor, and a controller configured to estimate a transparent clamp area of the optical disc based on the output signal, estimate a position of a center hole part of the optical disk based on the estimated clamp area, and detect presence of a foreign matter in the center hole part when a light-blocking percentage in the center hole part indicated by the output signal is equal to or higher than a predetermined value.

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Iwaki, Japan

Hiroki Shimizu