Hitachi High-tech Science Corporation

Hiroki Okawa

Jun Horigome

Imari Sato

Takahiro Tamashima

Yinqiang Zheng

A method of obtaining a quantum efficiency distribution in a predetermined sample surface, including: irradiating a reference material with excitation light belonging to a first wavelength range; obtaining the reference material's image, which includes a first channel for the first wavelength range and a second channel for a second wavelength range, the first and the second channel's irradiation luminance value in each pixel; irradiating the predetermined sample surface with the excitation light; obtaining the first and the second channel's measurement luminance value in each pixel of the image of the predetermined surface; calculating an absorption luminance value from a difference between the first channel's irradiation luminance value and measurement luminance value; calculating a fluorescence luminance value from difference between the second channel's irradiation luminance value and measurement luminance value; calculating quantum efficiency of each pixel based on the values; and obtaining quantum efficiency distribution.

Method of obtaining quantum efficiency distribution, method of displaying quantum efficiency distribution, program for obtaining quantum efficiency distribution, program for displaying quantum efficiency distribution, fluorescence spectrophotometer, and display device

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Tokyo, Japan

Hiroki Okawa