Adv Antest Corporation

Hitachi, Ltd.

Pentel Kabushiki Kaisha

Hiroki Kimura

Yuichi Miyaji

Takayuki Oshima

Tomoyuki Miyoshi

Takashi Sekine

Yohei Yanagida

Kenji Miyakoshi

Ikuo Takagishi

Aya Otsubo

Kiyonori Yasuike

Chisato Maeda

Adverse effects can be hardly exerted on a current performance of an LDMOSFET to suppress the amount of carrier implantation from an anode layer of an LDMOS parasitic diode, and improve a reverse recovery withstand of the parasitic diode. The LDMOSFET includes a semiconductor substrate having a first semiconductor region formed of a feeding region of a first conductivity type at a position where a field oxide film is not present on a surface layer of a semiconductor region in which the field oxide film is selectively formed, and a second semiconductor region formed of a well region of a second conductivity type which is an opposite conductivity type, and feeding regions of the first conductivity type and the second conductivity type formed on an upper layer of the well region, and a gate electrode that faces the well region through a gate oxide film. The feeding region of the first semiconductor region is formed at a distance from the field oxide film near an end portion remote from the gate electrode, and desirably the feeding region is intermittently formed at intervals in the longitudinal direction.

Semiconductor device

An ink composition for ballpoint pens comprises a coloring agent, a liquid medium, a polyoxyethylene castor oil and/or a polyoxyethylene hardened castor oil, or a derivative thereof, and one compound or a mixture of two or more compounds selected from the group consisting of a monoalkyl ether phosphoric acid, a polyoxyethylene monoalkyl ether phosphoric acid, a dialkyl ether phosphoric acid, a polyoxyethylene dialkyl ether phosphoric acid, a trialkyl ether phosphoric acid, and a polyoxyethylene trialkyl ether phosphoric acid.

Ink for ballpoint pens and ballpoint pen using same

There is provided a switch circuit for switching whether to output an input signal, including: a transmission path that transmits the input signal from an input end to an output end of the switch circuit; a first semiconductor switch that is provided on the transmission path and switches whether to transmit the input signal; a second semiconductor switch that is opened when the first semiconductor switch is short-circuited, and that is short-circuited when the first semiconductor switch is opened, thereby grounding, to a ground potential, a high-frequency signal leaked to the transmission path between the first semiconductor switch and the output end; and a voltage controller that causes a potential difference on both ends of the second semiconductor switch when the second semiconductor switch is opened.

Switch circuit, filter circuit and test apparatus

There is provided a signal reading apparatus that reads an output signal from a solid-state image sensing device. The apparatus includes a plurality of measuring means that respectively measures pixel data included in the output signal from the solid-state image sensing device and a timing generator that generates a clock signal showing a timing at which each of the plurality of measuring means measures the pixel data from the solid-state image sensing device and respectively supplies the clock signal to the plurality of measuring means in order to make the plurality of measuring means sequentially measure the pixel data from the solid-state image sensing device by means of an interleaving operation.

Signal reading apparatus and test apparatus

There is provided a buffer circuit that outputs a signal according to an input signal. The buffer circuit includes a first receiving transistor that receives the input signal through its base terminal, a first clamp transistor having polarity same as that of the first receiving transistor, of which an emitter terminal and a collector terminal are connected to corresponding terminals of the first receiving transistor and which receives a first clamp voltage restricting a signal level output from the buffer circuit through its base terminal, and a first current defining section that is commonly provided for the first receiving transistor and the first clamp transistor and defines a total amount of emitter currents flowing into the first receiving transistor and the first clamp transistor. The buffer circuit outputs an output signal according to an emitter voltage of the first receiving transistor.

Buffer circuit, amplifier circuit, and test apparatus

An oscillating apparatus is provided that includes: an integration circuit that outputs a control signal based on an integration value of two inputted voltage values; an oscillator that outputs an oscillation signal of a frequency that is based on the control signal; a phase comparator that outputs a phase difference signal of a pulse width that is in accordance with a phase difference between the oscillation signal and the reference signal, by comparing the oscillation signal with a reference signal of a predetermined frequency; a controlling circuits that controls the two inputted voltage values based on the phase difference signal, so as to approximate a phase difference between the oscillation signal and the reference signal to a predetermined reference phase difference; and a voltage stabilizing current that defines the two inputted voltages based on a predetermined reference voltage.

Oscillating apparatus

There is provided a test apparatus for testing a device under test, the test apparatus including: a test signal supplying section that supplies a digital input signal for testing purposes, to the device under test; a reference signal output section that outputs an analogue reference signal in accordance with the digital input signal; a difference obtaining section that outputs an analogue difference signal representing a difference between the analogue reference signal and an analogue output signal outputted by the device under test in accordance with the digital input signal; and a determining section that determines whether the analogue output signal shows a defect or not based on the analogue difference signal.

Test apparatus, manufacturing method, and test method

An oscillating apparatus is provided that includes: a filter circuit that includes a capacitor and outputs a control signal based on an amount of charge accumulated in the capacitor; an oscillator that outputs an oscillation signal of a frequency that is based on the control signal; a phase comparator that compares the oscillation signal with a reference signal of a predetermined frequency, to detect a phase difference between the oscillation signal and the reference signal; a switch circuit that controls whether to charge the capacitor according to a predetermined charge current or to discharge the capacitor according to a predetermined discharge current, based on the phase difference; and a current stabilizing current that defines each of the charge current and the discharge current based on a predetermined reference current or a reference voltage.

An oscillation detecting apparatus for detecting oscillation of a signal includes a high pass filter for generating an alternating current signal from which a direct current component of the signal is removed, a slicing circuit for generating a limit signal which results from restricting an amplitude level of the alternating current signal to a level lower than a predetermined level, an integration circuit for integrating a waveform of the limit signal during a predetermined period, and a comparator for detecting whether or not the signal oscillates based on a value of the waveform integrated by the integration circuit.

Oscillation detecting apparatus and test apparatus

A calibration circuit of an AC/DC converter which measures an AC voltage by converting the AC voltage to a DC voltage. The AC/DC converter measures the AC voltage with high accuracy with low cost by having a calibration circuit to correct the frequency response characteristic involved in an AC/DC conversion process. The AC/DC converter includes a signal generator for generating at least two calibration signals having the same energy level and different frequency spectrums, a switch for selecting the input signal to be measured or one of the calibration signals from the signal generator, an amplifier for amplifying the selected signal from the switch wherein the amplifier has a circuit arrangement for adjusting a frequency characteristic thereof, and an AC/DC conversion circuit for converting an AC voltage from the amplifier to a corresponding DC voltage.

Growing community of inventors

Tokyo, Japan

Hiroki Kimura