Advantest Test Solutions, Inc.

Hiroki Ikeda

Samer Kabbani

Karthik Ranganathan

Gregory Cruzan

Ira Leventhal

Gilberto Oseguera

Toshiyuki Kiyokawa

A testing apparatus comprises a tester comprising a plurality of racks, wherein each rack comprises a plurality of slots, wherein each slot comprises: (a) an interface board affixed in a slot of a rack, wherein the interface board comprises test circuitry and a plurality of sockets, each socket operable to receive a device under test (DUT); and (b) a carrier comprising an array of DUTs, wherein the carrier is operable to displace into the slot of the rack, and wherein each DUT in the array of DUTs aligns with a respective socket of the plurality of sockets on the interface board. The testing apparatus further comprises a pick-and-place mechanism for loading the array of DUTs into the carrier and an elevator for transporting the carrier to the slot of the rack.

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Kukishi Saitama, Japan

Hiroki Ikeda