Hitachi High-tech Corporation

Hiroki Akase

Rei Konishi

Masahiko Iijima

Chie Yabutani

Kei Shioya

Takanori Sawada

Masaaki Sakaguchi

When washing the inside of a reactor vessel which is used repeatedly, a rough suction is performed before suctioning with a washing tip; however, unwanted washing liquid may remain that may affect analysis results. The present invention provides an automatic analysis device for analyzing a sample using light, in which the automatic analysis device is characterized in that: a washing mechanism comprises a washing liquid supply nozzle that supplies washing liquid to a reactor vessel after analysis, a washing liquid suction nozzle that suctions the supplied washing liquid, a washing tip provided to the bottom end of the washing liquid suction nozzle, and a rough suction nozzle that suctions, in advance, a liquid within the reactor vessel before suctioning with the washing tip; and after the rough suction, liquid is caused to remain so that the bottom surface of the reactor vessel is not exposed.

Automatic analysis device

Addressing the problem of preventing contamination, the present invention is characterized by being provided with a reagent nozzle (H) for discharging a reagent (M) at a predetermined discharge pressure to a reaction vessel (V) in which a specimen (M) is accommodated, a control unit for controlling the horizontal position of the reagent nozzle (H) in accordance with the liquid amount of the reagent (M) and the viscosity of the reagent (M), a dispensing unit for dispensing the reagent (M) into the reaction vessel (V), and a photometer for detecting light radiated to a mixture of the specimen (M) and the reagent (M), the control unit setting the horizontal position of the reagent nozzle (H) to the center position of the reaction vessel (V) when the liquid amount of the reagent (M) is greater than the amount of the specimen (M) and the viscosity of the reagent (M) is equal to the viscosity of the specimen (M) or lower than the viscosity of the specimen (M).

Automatic analysis device and automatic analysis method

Growing community of inventors

Tokyo, Japan

Hiroki Akase