Sony Corporation

Hirokazu Sawada

Koji Inoue

Hideya Takahashi

Ryoichi Yamane

Yoshikazu Kanaishi

Izuru Nagahara

A battery device having a large number of secondary cells in which the voltage of a large number of secondary batteries can be detected and controlled to facilitate the handling and to improve the reliability. The battery device is made up of a modular casing , a large number of secondary batteries housed in the modular casing , plural cell control units and an exterior casing accommodating the modular casing . The modular casing has an inner casing member and an outer casing member and has a large number of terminal openings opened in it. The secondary batteries are housed in the modular casing via the terminal openings so that positive terminal and negative terminal are alternately exposed to outside. A pre-set number of secondary batteries are grouped together as a set, with the totality of the secondary batteries being arranged in a plurality of such sets. The cell control unit has the functions of detecting and controlling the voltage of each battery module and each secondary battery and of inputting and outputting detection and control signals. The exterior casing is provided with a positive electrode terminal , a negative electrode terminal and a transmission/reception terminal of the cell control unit

Battery device for loading on a mobile system

The layout of a semiconductor IC is determined making use of a first logical cell of an ordinary flip-flop based on a logical net. Logical simulation is performed according to the result of the layout, that is, the layout information. The possibility of erroneous operation caused by timing deviations is verified by comparing the timing information from the result of the logical simulation with the design specifications. Furthermore, the logical cells at points where there is the possibility of erroneous operation caused by timing deviations are replaced by second or third logical cells having delay elements connected to data input or output terminals of the flip-flops. The final layout of the semiconductor IC is then decided.

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Kanagawa, Japan

Hirokazu Sawada