Fujitsu Corporation

Hirokazu Kanma

Masahiro Tanaka

Kenji Furuya

Akira Takenouchi

A semiconductor device includes: a plurality of function blocks; a plurality of buses, each of which is respectively connected to one of the plurality of function blocks; a plurality of control signal lines, each of which is respectively connected to one of the plurality of function blocks; a main bus; a bus control unit connected to the main bus; a bus division control unit located between the plurality of buses and the main bus, for connecting one of the plurality of buses to the main bus and transmitting a control signal to a corresponding one of the plurality of control signal lines in accordance with a decoded result of information supplied from the bus control unit via the main bus, thereby controlling a corresponding one of the plurality of function blocks.

Semiconductor device

A semiconductor memory device includes a plurality of cell blocks each having a plurality of memory cells, a plurality of bit lines for reading data from the individual memory cells, and a precharge circuit for precharging one bit line selected from among the plurality of bit lines in response to a precharge signal. It is determined whether charge in the precharged bit line is to be discharged based on a data content of a memory cell in the cell block selected by a row decoder connected to the bit line. The data content of the selected memory cell in the selected cell block is read out by a potential of the bit line. The memory device further includes at least one gate switching element connected in series to the memory cells of each of the cell blocks. The gate switching element, together with the memory cells of each cell block, forms a series circuit which has one end connected to an associated one of the bit lines and a second end connected to a low-voltage power supply. A mode setting circuit enables the gate switching element during precharging in a fast data reading mode, and disables the gate switching element during precharging in a slow data reading mode.

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Kasugai, Japan

Hirokazu Kanma