Hitachi, Ltd.

Hitachi-Ge Nuclear Energy, Ltd.

Hirofumi Ouchi

Akira Nishimizu

Yoshio Nonaka

Hisashi Endo

Isao Yoshida

Naoyuki Kono

Masahiro Koike

So Kitazawa

Yosuke Takatori

Akihiro Taki

Kenichi Otani

Soshi Narishige

Masafumi Imai

Makoto Senoo

Yuuichi Narumi

Taiichiro Yamada

Yoshiharu Abe

An eddy current flaw detection system includes an eddy current flaw detection probe having a substrate facing an inspection surface, and at least one exciting coil and at least two detecting coils provided on the substrate, a scanning device which scans the probe on the inspection surface, a scan control device which drives and controls the scanning device, an eddy current flaw detection device which acquires results of detection of a plurality of detection points corresponding to combinations of the exciting and detecting coils for each scan position of the probe, and a data processing/display device which processes data from the scan control device and the eddy current flaw detection device and thereby displays a result of flaw detection. The data processing/display device acquires three-dimensional coordinates of the detection points for each scan position of the probe and thereby creates three-dimensional flaw detection data.

Eddy current flaw detection system and eddy current flaw detection method

Disclosed is an eddy current flaw detection probe that is capable of pressing itself against an inspection target whose curvature varies. A flaw sensor is configured by fastening a plurality of coils to a flexible substrate that faces the surface of the inspection target. A first elastic body is positioned opposite the inspection target for the flaw sensor, is obtained by stacking two or more elastic plates, and has an elastic coefficient that varies in a longitudinal direction. A second elastic body is a porous body positioned between the flexible substrate and the first elastic body. A pressure section is employed to press the first elastic body toward the inspection target.

Eddy current flaw detection probe

An eddy current testing device which confirms that a change in characteristics of a target object is detected regardless of the magnitude of the change and specifying the position of a portion from which the change is detected. The device uses an eddy current probe to inspect a bent portion of a metal body, and has an inspection controller and a display unit. The inspection controller calculates a phase angle of a signal detected by the eddy current probe and generates flaw identification image data that indicates an area (or an area of the signal detected and determined to correspond to a flaw signal, based on the phase angle of the detected signal) of a flaw signal in coordinates in which the position of the portion of the target object is plotted along a coordinate axis. The display unit displays the flaw identification image data.

Eddy current testing device

An eddy current flaw detection sensor is provided which can detect a circumferential crack occurring at the deformed portion or peripheral portion thereof of a heat transfer tube with a high degree of sensitivity. Two excitation coilscause eddy current B to flow in the axial direction of a tubular test objectA detection coildisposed between the excitation coilsdetects bypass eddy current D which flows in the circumferential direction of the test objectwhile bypassing a circumferential crack E. For this purpose, the coil axes of the excitation coilsare directed to the radial direction of the cylindrical protection memberand the coil axis of the detection coilis directed to the axial direction of the protection member

Eddy current flaw detection sensor and method

Growing community of inventors

Mito, Japan

Hirofumi Ouchi