Kaisei Engineer Co., Ltd.

Hiroaki Kohama

Kazuhiko Yasohama

Hirofumi Takahashi

Makio Iwamoto

Ichiro Fujitomi

Takayuki Yamaki

Any inspection object regardless of material can easily be inspected or discriminated with high accuracy and high sensitivity by being placed in a magnetic field generated by applying an alternating current to an exciting coil and detecting changes of voltage level and phase of electromotive force induced by a detection coil unit. The discrimination of the inspection object is performed on the basis of a DC voltage value with respect to a standard specimen and a phase differential voltage value with respect to a phase difference between the phase of a voltage signal from the induction coil and the phase of the exciting current to the exciting coil.

Electromagnetic induction type inspection device and method

An electromagnetic-induction type inspection device for inspecting a test specimen by placing the specimen in electromagnetic fields produced by exciting coils, detecting induction currents from induction coils set in the electromagnetic fields, and analyzing a composite signal composed of the amplitude and phase components contained in a differential current between the induction currents. The composite signal is expressed as a waveform which is displayed on a display unit, so that deformed portions of the waveform, which represent internal defects or other abnormalities in the specimen, can be identified.

Electromagnetic-induction type inspection device employing two induction

An electromotive induction current which is detected by an induction coil placed in an electromagnetic field generated by applying an alternating current to an exciting coil distinctively changes with the frequency of the applied alternating current in accordance with the conditions of an object placed in the electromagnetic field. By analyzing the change in amplitude and/or frequency phase of the electromotive induction current, the physical properties, size and relative position of the object and internal defects such as a crack and pin hole in the object can be measured precisely.

Electromagnetic induction inspection apparatus and method employing

An inspection device has an exciting coil for generating an electromagnetic field and an induction coil which are integrally connected to each other a coaxial relation so as to induce mutual inductance in the induction coil by the electromagnetic field. The mutual inductance caused in the induction coil varies with a given object to be inspected which is present in the electromagnetic field. The object can be inspected by analyzing the change in inductance.

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Tokyo, Japan

Hiroaki Kohama