International Business Machines Corporation

Synopsys, Inc.

Hillel Mendelson

Vitali Sokhin

Tom Kolan

Shay Aviv

Shai Doron

Hernan Theiler

Alex Lvovsky

Wesam Saleem Ibraheem

Tom Har'el Kolan

Embodiments relate to a system, program product, and method for integrating compiler-based testing in post-silicon validation. The method includes generating a test program through a device-under-test (DUT). The method also includes generating a plurality of memory intervals and injecting the plurality of memory intervals into the test program. The method further includes injecting a plurality of compiled test snippets into the test program and executing one or more post-silicon validation tests for the DUT with the test program.

Compiler-based code generation for post-silicon validation

A method, apparatus and product for utilizing address translation structures for testing address translation cache. The method comprises: obtaining a first address translation structure that comprises multiple levels, including a first top level which connects a sub-structure of the first address translation structure using pointers thereto; determining, based on the first address translation structure, a second address translation structure, wherein the second address translation structure comprises a second top level that is determined based on the first top level, wherein the second top level connects the sub-structure of the first address translation structure; executing a test so as to verify operation of an address translation cache of a target processor at least by: adding a plurality of cache lines to the address translation cache, wherein said adding is based on the address translation structures; and verifying the operation of the address translation cache using one or more memory access operations.

Testing address translation cache

Embodiments relate to a system, program product, and method for random generation of recoverable errors in the generated instruction stream for post-silicon validation testing. The intentional raising and handling of exceptions in post-silicon validation exercisers randomly creates recoverable errors in a generated instruction test stream. Multiple exceptions may be raised either in a single instruction or in multiple instructions, while the present instruction is permitted to fully execute. The errors responsible for raising the exceptions are automatically repaired.

Recoverable exceptions generation and handling for post-silicon validation

A method for testing an integrated circuit, comprising: accessing a database associated with a test template, wherein said test template is configured to test a selected function of the integrated circuit; storing, in said database, data corresponding to at least partial predicted results of one or more random instruction sequences generated based on said test template; generating, by an automated test generation tool, a random instruction sequence based on said test template; executing said instruction sequence by a hardware exerciser, in the integrated circuit; and comparing results of said instruction sequence with said at least partial predicted results, to verify a function of said integrated circuit.

Partial-results post-silicon hardware exerciser

A method, apparatus and a product for utilizing translation tables for testing processors. The method is used for testing a target processor that utilizes different translation tables to translate virtual addresses to physical addresses. The method comprises obtaining a test template that comprises directives to be executed in different contexts, during each of which a different translation table is utilized to translate virtual addresses to physical addresses. The translation tables to be used by the target processor in the different contexts are determined, so that the translation tables overlap, at least in part.

Utilizing translation tables for testing processors

Method, apparatus and product for automatically introducing register dependency into tests. A test template represents an abstract test scenario to be utilized for testing a target processor. The abstract test scenario requires that a value be assigned to a register. A test that implements the abstract test scenario is generated. The test is a set of instructions that are executable by the target processor. The generation of the test comprises: determining a memory address to retain the value in a memory that is accessible to the target processor; and adding to the test an instruction to load to the register the value from the memory address, whereby adding a register dependency to the test that is not required by the abstract test scenario. The test can be executed on the target processor or simulation thereof.

Automatically introducing register dependencies to tests

A method, system and computer program product, the method comprising: obtaining a test template comprising a multiplicity of elements, including a first element and another element; generating a partially instantiated test template comprising a first instance for the first element and the another element in an uninstantiated form; generating, based on the partially instantiated test template, a first test complying with the test template, the first test comprising the first instance for the first element and an instance for the another element; executing the first test to obtain a first result; generating, based on the partially instantiated test template, a second test complying with the test template, the second test comprising the first instance for the first element and another instance for the another element, thereby using the first instance for generating the first and second tests; and executing the second test to obtain a second result.

Method and apparatus for test generation

A computer-implemented method, computerized apparatus and computer program product for verification of atomic memory operations are disclosed. The method comprising: independently generating for each of a plurality of threads at least one instruction for performing an atomic memory operation of a predetermined type on an allocated shared memory location accessed by the plurality of threads; and, determining an evaluation function over arguments comprising values operated on or obtained in performing the atomic memory operation of the predetermined type on the allocated shared memory location by each of the plurality of threads; wherein the evaluation function is determined based on the atomic memory operation of the predetermined type such that a result thereof is not effected by an order in which each of the plurality of threads performs the atomic memory operation of the predetermined type on the allocated shared memory location.

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Kibbutz Hahotrim, Israel

Hillel Mendelson