Hitachi, Ltd.

Hideyuki Takahashi

Hiroyuki Yoshioka

Ryuichi Satomura

Hidefumi Yoshida

Kazutaka Mori

Keiichi Higeta

Mitsugu Kusunoki

Masato Hamamoto

Atsushi Wakahara

Masaki Kouno

Shogo Irikura

Shougo Matsuda

Akihiko Goto

An optical receiver circuit is configured as follows: a preamplifier and a reference voltage generating circuit are connected with a first ground potential wiring and a first power supply wiring, which are used in common, and are formed in a first region where elements are formed on a substrate to which the potential of the first ground potential wiring is supplied; a main amplifier is connected with a second ground potential wiring and a second power supply wiring, which are separated from the first ground potential wiring and the first power supply wiring, and is formed in a second region where elements are formed on the substrate to which the potential of the second ground potential wiring is supplied; and a substrate supply interval where a first substrate supply position at which the potential of the first ground potential wiring is supplied and a second substrate supply position at which the potential of the second ground potential wiring is supplied are closest to each other is large to an extent where a substrate permeability characteristic, in which noise is fully attenuated in an alternating current (AC) manner, is obtained.

Optical receiver circuit

To solve problematic trade-off between a bandwidth and a in-band deviation in an optical signal receiving circuit of a gigabit order that is required to have a wide dynamic range, the optical signal receiving circuit has a current-voltage conversion circuit that receives as an input a current signal outputted from a photoelectric conversion circuit for receiving and converting an optical signal into a current signal and converts it into a voltage signal, and realizes the wide dynamic range by providing the current-voltage conversion circuit with an AGC function and a phase compensation function by MOS transistors and a capacitance. Further, by providing the current-voltage conversion circuit with a second phase compensation function by a MOS transistor and a capacitance, it is made possible for the optical signal receiving circuit to reduce the in-band deviation at the time of minimum gain while securing the bandwidth at the time of maximum gain.

Optical signal receiving circuit

An optical signal receiving circuit has a current-voltage converting circuit which receives the output current signal of a photoelectric converting circuit, converting an optical signal into the current signal, and converts the current signal into a voltage signal. A differential circuit in the subsequent stage to the current-voltage converting circuit uses a resistor as its current source to facilitate setting of an operating voltage level in the circuit. To eliminate an adverse effect of asymmetry of the output waveform from the differential circuit due to the use of the resistor, the reference voltage level as the other input to the reference circuit is generated from the output voltage signal of the current-voltage converting circuit by a voltage generating circuit incorporating a feed-forward-controlling connection. Thus, coexistence of high bandwidth characteristics and broad dynamic range having so far been difficult to attain by low voltage apparatus can be realized.

Optical signal receiving circuit and optical signal receiving apparatus

A manufacturing method of a semiconductor device capable of obtaining highly reliable semiconductor devices with the realization of high integration and high speed intended is provided. During processes after a desired circuit including a CMOS static type circuit is formed on a semiconductor substrate until product shipment, a first operation of feeding a predetermined input signal to the circuit and retrieving a first output signal corresponding to it and a second operation of giving an operating condition of increasing an ON resistance value of MOSFETs constituting the CMOS static type circuit and retrieving a second output signal corresponding to the condition are conducted, and a testing step of determining a failure by the first output signal varying from the second output signal.

Manufacturing method of semiconductor device

Growing community of inventors

Hachioji, Japan

Hideyuki Takahashi