Growing community of inventors

Wako, Japan

Hideyuki Sunaga

Average Co-Inventor Count = 5.00

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 6

Hideyuki SunagaYoshie Otake (6 patents)Hideyuki SunagaYuichi Yoshimura (5 patents)Hideyuki SunagaShigenori Nagano (4 patents)Hideyuki SunagaKoji Ikado (3 patents)Hideyuki SunagaHisashi Tsukada (2 patents)Hideyuki SunagaHanako Aikoh (1 patent)Hideyuki SunagaTomohiro Kobayashi (1 patent)Hideyuki SunagaMaki Mizuta (1 patent)Hideyuki SunagaXiaobo Li (1 patent)Hideyuki SunagaHideyuki Sunaga (6 patents)Yoshie OtakeYoshie Otake (14 patents)Yuichi YoshimuraYuichi Yoshimura (8 patents)Shigenori NaganoShigenori Nagano (15 patents)Koji IkadoKoji Ikado (3 patents)Hisashi TsukadaHisashi Tsukada (45 patents)Hanako AikohHanako Aikoh (3 patents)Tomohiro KobayashiTomohiro Kobayashi (2 patents)Maki MizutaMaki Mizuta (2 patents)Xiaobo LiXiaobo Li (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Riken Corporation (6 from 852 patents)

2. Topcon Corporation (5 from 524 patents)


6 patents:

1. 11985755 - Target structure and target device

2. 11754516 - Nondestructive test system comprising a neutron emission unit for emitting fast neutrons and a neutron detection unit for detecting thermal neutrons, and nondestructive test method

3. 11747288 - Non-destructive inspection system comprising neutron radiation source and neutron radiation method

4. 11614415 - Nondestructive testing system and nondestructive testing method

5. 11609190 - Non-destructive inspection method

6. 11513084 - Nondestructive inspecting system, and nondestructive inspecting method

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as of
12/10/2025
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