Average Co-Inventor Count = 3.56
ph-index = 8
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Hitachi, Ltd. (10 from 42,485 patents)
2. Nippon Steel & Sumitomo Metal Corporation (6 from 1,098 patents)
3. Kabushiki Kaisha Toshiba (3 from 52,711 patents)
4. Toyota Jidosha Kabushiki Kaisha (2 from 36,499 patents)
5. Nec Electronics Corporation (2 from 2,467 patents)
6. Mitsubishi Electric Corporation (1 from 15,844 patents)
7. Seikosha Co., Ltd. (1 from 696 patents)
8. Toshiba Energy Systems & Solutions Corporation (1 from 301 patents)
9. Nippon Precision Circuits Inc. (1 from 100 patents)
10. Nippon Steel Corporation (3,542 patents)
23 patents:
1. 12330694 - Rail vehicle
2. 11165291 - Stator core support device and rotating electrical machine
3. 10594176 - Rotor, rotating electric machine, electric compressor, and refrigeration/air-conditioning apparatus
4. 10167538 - Steel pipe
5. 9841279 - Apparatus and method for quantitative evaluation of braze bonding length with use of radiation
6. 9812834 - Rotor of rotating electric machine
7. 9149850 - Roll former for steel plate and roll bending method for steel plate using same
8. 9050646 - Automobile chassis part excellent in low cycle fatigue characteristics and method of production of same
9. 8894080 - Press-forming method of tubular part having cross section of irregular shape, and tubular part having cross section of irregular shape formed by the press-forming method
10. 8828159 - Steel material for automobile chassis parts superior in fatigue characteristics and method of production of automobile chassis parts using the same
11. 8778261 - Steel material for automobile chassis parts superior in fatigue characteristics and method of production of automobile chassis parts using the same
12. 7719879 - Semiconductor integrated circuit
13. 7438001 - Car body structure
14. 6722285 - Railway car
15. 6668348 - Memory-mounting integrated circuit and test method thereof