Kabushiki Kaisha Toshiba

Hideyuki Kitazono

Toshifumi Sato

Mikio Izumi

Naotaka Oda

Toshiaki Ito

Tatsuyuki Maekawa

Teruji Tarumi

Toshifumi Hayashi

Shigeru Odanaka

An apparatus for inspecting and testing a startup range neutron monitoring system for a nuclear reactor. The apparatus includes: a neutron-flux detector; a preamplifier that amplifies an electric signal output from the neutron-flux detector; a pulse measurement unit that counts times when electric signal output from the preamplifier exceeds a discrimination voltage; a discrimination-voltage setting unit that applies the discrimination voltage to the pulse measurement unit; a voltage-setting unit that applies a voltage to the neutron-flux detector; an arithmetic processing unit that calculates an output power of the reactor based upon an output signal of the pulse measurement unit; an output unit that outputs data representing the output power of the reactor, calculated by the arithmetic processing unit; and an inspecting/testing unit that sets the discrimination voltage and the voltage to be applied by the voltage-setting unit.

Apparatus for inspecting and testing startup range neutron monitoring system

A safety protection instrumentation system for a nuclear reactor is constructed by using digital logic. The digital logic includes functional units in which output logic patterns corresponding to all input logic patterns are verified in advance and a functional module formed by combining the functional units.

Safety protection instrumentation system and method of operating the system

An apparatus for verifying a custom IC including a test pattern generating unit for generating a test pattern for verifying a function of the custom IC. The test pattern is output to a master IC and a test IC. The apparatus further includes a comparing unit connected to receive operation signals output from the master IC and the test IC for comparing the operation signals to see if the operation signals are agreed with each other and for generating a comparison signal based on a comparison result, a judging unit connected to receive the comparison signal for judging if there is any abnormality in the test IC and for outputting a judged signal based on a judged result, and a computer connected to receive the judged signal for displaying the judged result of the test IC.

Apparatus and method for verifying custom IC

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Tokyo, Japan

Hideyuki Kitazono