Keyence Corporation

Hidetoshi Morimoto

Naoya Uchiyama

Akinobu Seri

Inputs of a plurality of images constituting a group of images of items regarded as non-defective items are previously accepted and stored, and a defect threshold for detecting a defective portion of an inspection object is set based on the plurality of stored images. A defect amount to be compared with a determination threshold for making a non-defective/defective determination on the inspection object is calculated with respect to each of the plurality of stored images based on the set defective threshold, and whether or not each of the calculated defect amounts is an outlier is tested by use of at least one of a parametric technique and a non-parametric technique. Outlier information for specifying an image whose defect amount has been tested to be the outlier is displayed and outputted.

Visual inspection device, visual inspection method, and computer program

The invention provides an image processing device and an image processing method which can efficiently make use of memory resources, and can also edit and simulate a registered image or the like so as to reflect the registered image or the like after editing in a normal operation without stopping the normal operation, and further to enhance production efficiency. When data for image processing edited in a second processing section is to be reflected in image processing (normal operation) that is continuously executed in a first processing section, the edited data for image processing is transmitted from a third data storage area to a second data storage area, and the edited data for image processing is read from the second data storage area when image processing is executed by use of the edited data for image processing in the first processing section.

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Osaka, Japan

Hidetoshi Morimoto