Oki Electric Industry Co., Ltd.

Hideto Koike

Tsutomu Fukui

Makoto Masuda

Kemmi Ayukai

Reiko Kishi

The present disclosure provides a surveillance device that monitors an operation section of an automated transaction device, the surveillance device including: a learning holding section that learns and holds a reference scene data set in which a reference operation is divided into a sequence of action items; a feature extraction section that extracts actual target action data from actual scene data of the sequence of action items in an operation of a user, the actual scene data obtained from an imaging section that faces and images the operation section; and a detection section that associates actual target action data with a reference scene data set along the sequence of action items, compares for each of the action items, determines an anomaly level of the operation of the user, and outputs an anomalous occurrence signal according to the anomaly level.

Surveillance device

An embodiment of the invention provides an automated transaction apparatus including: an operation unit; a peep preventing cover that is provided in the operation unit; a sensor that detects removal of the peep preventing cover; and a control unit that performs control such that a transaction of the automated transaction apparatus is paused in accordance with a detection result of the sensor.

Automated transaction apparatus

In a medium detecting system having a plurality of optical sensors, each including a light-emitting element and a light-receiving element whose current varies with the amount of light received, and a load resistance unit provided in common for the sensors, the resistance of the load resistance circuit can be varied in accordance with load resistance selecting data supplied thereto. A sensor selector is responsive to sensor selecting data for selecting one of the sensors and connecting the light-receiving element of the selected sensor to the load resistance unit. A rewritable memory stores the sensor selecting data and data used for selecting the load resistance.

Growing community of inventors

Tokyo, Japan

Hideto Koike