Adv Antest Corporation

Hideo Hara

Shin Masuda

Atsushi Seki

Tsuyoshi Ataka

Shunsuke Abe

According to the present invention, an optical device includes: a first electro-optical member and a second electro-optical member. The first electro-optical member has two convex portions spaced from each other by a recessed portion and a connecting portion arranged under the recessed portion to connect the two convex portions, the first electro-optical member exhibiting an electro-optical effect. The second electro-optical member has a recessed portion member arranged within the recessed portion, the second electro-optical member exhibiting an electro-optical effect. The permittivity of the first electro-optical member is higher than the permittivity of the second electro-optical member. The refractive index of the first electro-optical member is higher than the refractive index of the second electro-optical member. During application of an electric field, light to be transmitted is applied to the recessed portion member.

Optical device

Provided is a test apparatus including an optical test signal generating section that generates an optical test signal; an optical signal supplying section that supplies the optical test signal to a device under test that is a testing target among a plurality of the devices under test; a first optical switch section that selects, from among optical signals output by the plurality of devices under test, the optical signal output by the device under test that is the testing target; and an optical signal receiving section that receives the selected optical signal.

Test apparatus, test method, calibration device, and calibration method

A test apparatus that easily tests a device under test having an optical interface. Provided is a test method, a test apparatus, and a device interface apparatus on which is mounted a device under test having an optical interface, the device interface apparatus comprising a device mounting section on which the device under test is mounted; an optical connector that is connected to the optical interface of the device under test; and an optical signal detecting section that detects an optical signal output from at least one of the optical interface and the optical connector, before the optical interface of the device under test mounted on the device mounting section is connected to the optical connector.

Device interface apparatus, test apparatus, and test method

It is an object of the present invention to test a device under test including an optical interface. Provided is a device interface apparatus on which is loaded a device under test including an optical interface. The device interface apparatus comprises a device loading section on which the device under test is loaded; an optical connector that is to be connected to the optical interface of the device under test; and an optical connector moving section that moves the optical connector toward the optical interface of the device under test loaded on the device loading section, to optically connect the optical connector and the optical interface.

Device interface apparatus and test apparatus

To achieve high-speed optical modulation using a crystal having a complicated refractive index characteristic with respect to applied electric field, provided is an optical device comprising a substrate; a dielectric film that is formed on the substrate and includes a first optical waveguide and a second optical waveguide that run parallel to each other; a transmission line that is formed on the dielectric film and includes a signal line arranged between the first optical waveguide and the second optical waveguide, a first bias electrode, and a second bias electrode, the first bias electrode and the second bias electrode arranged respectively in a first region that is on a side of the first optical waveguide opposite the second optical waveguide and a second region on a side of the second optical waveguide opposite the first optical waveguide; and a drive circuit section that respectively applies a first bias voltage and a second bias voltage differing from each other to the first bias electrode and the second bias electrode, and applies a control voltage that is between the first bias voltage and the second bias voltage to the signal line.

Optical device and optical modulation apparatus

Provided is an optical modulator that modulates input light with a high frequency and low half-wave voltage. An optical device comprises a substrate; a dielectric film that is formed on the substrate and includes a first optical waveguide and a second optical waveguide that run parallel to each other; an insulating film formed on the dielectric film; a coplanar line that is formed on the insulating film and includes a signal line arranged between the first optical waveguide and the second optical waveguide, a first ground line arranged in a first region, and a second ground line arranged in a second region; and auxiliary electrodes that are arranged in the first region and the second region, are formed in contact with the dielectric film or within the insulating film, and apply bias voltages to the first optical waveguide and the second optical waveguide.

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Miyagi, Japan

Hideo Hara